Research progress on bonding wire for microelectronic packaging

H Zhou, Y Zhang, J Cao, C Su, C Li, A Chang, B An - Micromachines, 2023 - mdpi.com
Wire bonding is still the most popular chip interconnect technology in microelectronic
packaging and will not be replaced by other interconnect methods for a long time in the …

Evaluation of the corrosion performance of Cu–Al intermetallic compounds and the effect of Pd addition

ABY Lim, WJ Neo, O Yauw, B Chylak, CL Gan… - Microelectronics …, 2016 - Elsevier
Copper wire has become a mainstream bonding material in fine-pitch applications due to
the rising cost of gold wire. In recent years, palladium-coated copper (Pd–Cu) wire is being …

Effect of palladium on the mechanical properties of Cu–Al intermetallic compounds

ABY Lim, X Long, L Shen, X Chen… - Journal of Alloys and …, 2015 - Elsevier
There is growing interest in copper (Cu) wire bonding due to its significant cost savings over
gold wire. However, concerns regarding package reliability and corrosion susceptibility have …

Effects of alloying elements in high reliability copper wire bond material for high temperature applications

M Eto, N Araki, T Yamada, R Klengel, S Klengel… - Microelectronics …, 2020 - Elsevier
Recently, a shift from Au bonding wire to Cu bonding wire is expected for automotive
application. Palladium coated copper (PCC) wire is strong candidate since it is widely used …

A new reliable, corrosion resistant gold-palladium coated copper wire material

S Klengel, R Klengel, J Schischka… - 2019 IEEE 69th …, 2019 - ieeexplore.ieee.org
In this paper, we present studies for the new gold-palladium coated copper wire" EX1R" with
focus to application in the automotive industry. This wire material was developed to prevent …

Interfacial evolution and bond reliability in thermosonic Pd coated Cu wire bonding on aluminum metallization: Effect of palladium distribution

ABY Lim, CB Boothroyd, O Yauw, B Chylak… - Microelectronics …, 2016 - Elsevier
In this paper, the growth kinetics of Cu–Al intermetallic compounds formed during isothermal
annealing of Pd–Cu wire bonds with different palladium distribution at 175° C are …

Copper wire degradation under high temperature and high humidity without molding compound

MJZ Lim, M Goroll, HG Loh, Z Chen… - 2021 IEEE 23rd …, 2021 - ieeexplore.ieee.org
In this study, the degradation of copper wire under high temperature and high humidity is
investigated. Unbiased high temperature and high humidity accelerated stress test (uHAST) …

Temperature-dependence mechanical characteristics investigation of Cu wire and corresponding high strain rate plasticity behaviors enabled by Johnson–Cook …

DS Liu, PC Wen, ZW Zhuang, YC Chao… - Journal of …, 2023 - academic.oup.com
The temperature-dependence mechanical characteristics of 4N Cu wire with 25, 30 and 38
μm diameters are investigated via the utilization of micro-tensile tests. Measured data …

Influence of copper wire material to corrosion resistant packages and systems for high temperature applications

S Klengel, R Klengel, J Schischka… - … & Exhibition (EMPC), 2019 - ieeexplore.ieee.org
We present studies for a newly developed gold-palladium coated copper wire with focus to
the automotive industry. This wire material was designed to prevent halide induced interface …

Process optimization and reliability study for Cu wire bonding advanced nodes

I Qin, H Xu, B Milton, N Mendoza… - 2014 IEEE 64th …, 2014 - ieeexplore.ieee.org
Cu wire bonding has taken over Au wire bonding due to its cost savings and other
performance advantages such as higher mechanical strength for complex looping and better …