SiC detectors: A review on the use of silicon carbide as radiation detection material
M De Napoli - Frontiers in physics, 2022 - frontiersin.org
Silicon Carbide (SiC) is a wide bandgap semiconductor with many excellent properties that
make it one of the most promising and well-studied materials for radiation particle detection …
make it one of the most promising and well-studied materials for radiation particle detection …
Charged particle and photon interactions with matter: recent advances, applications, and interfaces
Y Hatano, Y Katsumura, A Mozumder - 2010 - books.google.com
Covering state-of-the-art advances, novel applications, and future perspectives, this volume
presents new directions on the basic studies of charged particle and photon interactions with …
presents new directions on the basic studies of charged particle and photon interactions with …
Advances in high-resolution radiation detection using 4H-SiC epitaxial layer devices
Advances towards achieving the goal of miniature 4H-SiC based radiation detectors for
harsh environment application have been studied extensively and reviewed in this article …
harsh environment application have been studied extensively and reviewed in this article …
High resolution alpha particle detection using 4H–SiC epitaxial layers: Fabrication, characterization, and noise analysis
In this article we report the fabrication and characterization of large area, room-temperature
operable and very high resolution Schottky barrier detectors for alpha particles using 20 μm …
operable and very high resolution Schottky barrier detectors for alpha particles using 20 μm …
A review of ion beam induced charge microscopy
MBH Breese, E Vittone, G Vizkelethy… - Nuclear Instruments and …, 2007 - Elsevier
Since its development in the early 1990's, ion beam induced charge (IBIC) microscopy has
found widespread applications in many microprobe laboratories for the analysis of …
found widespread applications in many microprobe laboratories for the analysis of …
Self-biased Mo/n-4H-SiC Schottky barriers as high-performance ultraviolet photodetectors
SK Chaudhuri, R Nag… - IEEE Electron Device …, 2023 - ieeexplore.ieee.org
We report a high photocurrent-to-dark current ratio (PDCR) of observed in Mo/4H-SiC
Schottky barrier diodes (SBDs) in self-biased mode when exposed to a 1.5 mW ultraviolet …
Schottky barrier diodes (SBDs) in self-biased mode when exposed to a 1.5 mW ultraviolet …
Experimental determination of electron-hole pair creation energy in 4H-SiC epitaxial layer: An absolute calibration approach
Electron-hole pair creation energy (ε) has been determined from alpha spectroscopy using
4H-SiC epitaxial layer Schottky detectors and a pulser calibration technique. We report an …
4H-SiC epitaxial layer Schottky detectors and a pulser calibration technique. We report an …
Radiation detection using n-type 4H-SiC epitaxial layer surface barrier detectors
SK Chaudhuri, KC Mandal - Advanced Materials for Radiation Detection, 2022 - Springer
While CdZnTe (CZT) is one of the best materials for room-temperature radiation detection,
they are not quite suitable for high-temperature or harsh-environment applications. This …
they are not quite suitable for high-temperature or harsh-environment applications. This …
Enhanced Hole Transport in Ni/Y₂O₃/n-4H-SiC MOS for Self-Biased Radiation Detection
SK Chaudhuri, OF Karadavut… - IEEE Electron …, 2022 - ieeexplore.ieee.org
We report the fabrication of novel self-biased high resolution radiation detectors achieved in
n-type 4H-SiC metal-oxide-semiconductor (MOS) devices. Vertical MOS structure has been …
n-type 4H-SiC metal-oxide-semiconductor (MOS) devices. Vertical MOS structure has been …
Effect of Z1/2, EH5, and Ci1 deep defects on the performance of n-type 4H-SiC epitaxial layers Schottky detectors: Alpha spectroscopy and deep level transient …
MA Mannan, SK Chaudhuri, KV Nguyen… - Journal of Applied …, 2014 - pubs.aip.org
Spectroscopic performance of Schottky barrier alpha particle detectors fabricated on 50 μm
thick n-type 4H-SiC epitaxial layers containing Z 1/2, EH 5, and Ci1 deep levels were …
thick n-type 4H-SiC epitaxial layers containing Z 1/2, EH 5, and Ci1 deep levels were …