State-of-the-art of the bond wire failure mechanism and power cycling lifetime in power electronics

L Xie, E Deng, S Yang, Y Zhang, Y Zhong… - Microelectronics …, 2023 - Elsevier
The purpose of this paper is to obtain the development direction for improving the reliability
of bond wires effectively in power electronics through overviewing the state-of-the-art of the …

CMOS-based microsensors and packaging

H Baltes, O Brand - Sensors and Actuators A: Physical, 2001 - Elsevier
CMOS-based microsensors benefit from well-established fabrication technologies and the
possibility of on-chip circuitry. In these devices, added on-chip functionality can be …

Piezo-FET stress-sensor arrays for wire-bonding characterization

M Doelle, C Peters, P Ruther… - Journal of …, 2006 - ieeexplore.ieee.org
This paper reports the design, fabrication, and characterization of a two-dimensional stress-
sensor array based on a stress-sensor element exploiting the transverse pseudo-Hall effect …

In situ ultrasonic force signals during low-temperature thermosonic copper wire bonding

A Shah, M Mayer, Y Zhou, SJ Hong, JT Moon - Microelectronic Engineering, 2008 - Elsevier
Ultrasonic in situ force signals from integrated piezo-resistive microsensors were used
previously to describe the interfacial stick-slip motion as the most important mechanism in …

Effects of bonding parameters on free air ball properties and bonded strength of Ag-10Au-3.6 Pd alloy bonding wire

J Cao, J Zhang, J Persic, K Song - Micromachines, 2020 - mdpi.com
Free air ball (FAB) and bonded strength were performed on an Ag-10Au-3.6 Pd alloy
bonding wire (diameter of 0.025 mm) for different electronic flame-off (EFO) currents, times …

Ultrasonic friction power during Al wire wedge-wedge bonding

A Shah, H Gaul, M Schneider-Ramelow… - Journal of applied …, 2009 - pubs.aip.org
Al wire bonding, also called ultrasonic wedge-wedge bonding, is a microwelding process
used extensively in the microelectronics industry for interconnections to integrated circuits …

[PDF][PDF] 超声功率对引线键合强度的影响

王福亮, 韩雷, 钟掘 - 机械工程学报, 2007 - qikan.cmes.org
采集键合试验的PZT 驱动功率及对应键合点的剪切测试力数据, 作为超声功率和引线键合强度的
表征. 试验中的键合力, 温度和时间分别设置为4.7 N, 室温和100 ms. 在这种典型的工业工艺键 …

The ultrasonic wedge/wedge bonding process investigated using in situ real-time amplitudes from laser vibrometer and integrated force sensor

H Gaul, A Shah, M Mayer, Y Zhou… - Microelectronic …, 2010 - Elsevier
The ultrasonic transversal force transmitted to a chip during ultrasonic bonding is derived
from measurements of the vibration amplitude at the tool tip and the die edge. To proof the …

[PDF][PDF] Ultrasonic bonding: understanding how process parameters determine the strength of Au-Al bonds

M Mayer, J Schwizer - PROCEEDINGS-SPIE THE INTERNATIONAL …, 2002 - Citeseer
The physics describing ultrasonic wire bonding is only partly known. A better understanding
how bond strength depends on process parameters could increase productivity by speeding …

[引用][C] 超声功率对粗铝丝超声引线键合强度的影响

王福亮, 韩雷, 钟掘 - 中国机械工程, 2005