Luminescence properties of defects in GaN

MA Reshchikov, H Morkoç - Journal of applied physics, 2005 - pubs.aip.org
Gallium nitride (GaN) and its allied binaries InN and AIN as well as their ternary compounds
have gained an unprecedented attention due to their wide-ranging applications …

APPLIED PHYSICS REVIEWS

MA Reshchikov, H Morkoç, HW Choi, E Gu… - Journal of Applied …, 2005 - pubs.aip.org
View article titled, Laser-induced refractive index gratings formed in< span class=" inline-
formula no-formula-id">< span class=" mathFormula"></span>< math xmlns=" http://www …

The mechanisms of thermal engineered laser shock peening for enhanced fatigue performance

Y Liao, S Suslov, C Ye, GJ Cheng - Acta Materialia, 2012 - Elsevier
Thermal engineered laser shock peening (LSP) is a technique combining warm laser shock
peening (WLSP) with subsequent post-shock tempering treatment to optimize the surface …

Ultra-low dark current AlGaN-based solar-blind metal–semiconductor–metal photodetectors for high-temperature applications

F Xie, H Lu, D Chen, X Ji, F Yan, R Zhang… - IEEE Sensors …, 2012 - ieeexplore.ieee.org
Solar-blind metal-semiconductor-metal (MSM) photodetectors (PDs) with Ni/Au semi-
transparent interdigitated contact electrodes are fabricated on Al 0.4 Ga 0.6 N epi-layer …

Comprehensive analysis of current leakage at individual screw and mixed threading dislocations in freestanding GaN substrates

T Hamachi, T Tohei, Y Hayashi, M Imanishi, S Usami… - Scientific Reports, 2023 - nature.com
The electrical characteristics of Schottky contacts on individual threading dislocations (TDs)
with a screw-component in GaN substrates and the structures of these TDs were …

[图书][B] Handbook of nanophysics: nanoelectronics and nanophotonics

KD Sattler - 2010 - taylorfrancis.com
Many bottom-up and top-down techniques for nanomaterial and nanostructure generation
have enabled the development of applications in nanoelectronics and nanophotonics …

Carrier Diffusion in : A Cathodoluminescence Study. III. Nature of Nonradiative Recombination at Threading Dislocations

J Lähnemann, VM Kaganer, KK Sabelfeld… - Physical Review …, 2022 - APS
We investigate the impact of threading dislocations with an edge component (a or a+ c type)
on carrier recombination and diffusion in Ga N (0001) layers close to the surface as well as …

Dislocation pinning effects induced by nano-precipitates during warm laser shock peening: Dislocation dynamic simulation and experiments

Y Liao, C Ye, H Gao, BJ Kim, S Suslov… - Journal of applied …, 2011 - pubs.aip.org
Warm laser shock peening (WLSP) is a new high strain rate surface strengthening process
that has been demonstrated to significantly improve the fatigue performance of metallic …

Fabrication of composition-controlled MOCVD grown InxGa1-xN based MSM photodetectors

S Surender, K Prabakaran, S Pradeep, ID Jacob, YF Lu… - Optical Materials, 2023 - Elsevier
Abstract Metal Semiconductor Metal (MSM) photodetector devices based on metal organic
chemical vapour deposition grown InGaN/GaN heterostructures with Ni/Au contacts has …

Correlation between structural properties and nonradiative recombination behaviors of threading dislocations in freestanding GaN substrates grown by hydride vapor …

Y Yao, Y Sugawara, D Yokoe, K Sato, Y Ishikawa… - …, 2020 - pubs.rsc.org
Correlations between the structural properties and nonradiative recombination (NRR)
behaviors of threading dislocations in freestanding hydride-vapor-phase-epitaxy (HVPE) …