Surface roughness seriously affects the electromagnetic performance of capacitive radio
frequency (RF) micro-electromechanical system (MEMS) switches. This review presents the …

With the technology advancement, electronic devices are miniaturized at every development
node. Physical parameters such as microscopic roughness are affecting these devices …

The urgent need to reduce the consumption of fossil fuels drives the demand for renewable
energy and has been attracting the interest of the scientific community to develop materials …

The parallel-plate capacitor equation is widely used in contemporary material research for
nanoscale applications and nanoelectronics. To apply this equation, flat and smooth …

A new hybrid approach consists to use the advantages of both systems namely the high
geometric aspects of the electrodes of the ultracapacitor and the high dielectric strength of …

In planar on-chip copper interconnects, conductor losses due to surface roughness
demands explicit consideration for accurate modeling of their performance metrics. This is …

Planar copper interconnects suffer from surface roughness that results in performance
degradation. This paper presents a novel analytical model for calculation effective resistivity …

Nodule-type polyaniline (PAni) has been successfully electrosynthesized onto conducting
substrate and envisaged in electrochemical supercapacitor (ES) application as a potential …

Variable parallel-plate microelectromechanical system (MEMS) capacitors have been used
extensively in various applications. The performances of MEMS capacitors are traditionally …

In this paper we describe several novel sparsification techniques used in a fast stochastic
integral equation solver to compute the mean value and the variance of capacitance of 3D …