EMI filter robustness in three-level active neutral-point-clamped inverter

Z Shen, M Chen, H Wang, X Wang… - IEEE Transactions on …, 2021 - ieeexplore.ieee.org
The electromagnetic interference (EMI) filter is a critical component for power electronics to
conform with the EMI standards, ensuring electromagnetic compatibility and a safe operating …

Machine learning and emi for mosfet aging diagnosis

CMA Taleb, JBH Slama, O Nasri… - 2023 5th Global Power …, 2023 - ieeexplore.ieee.org
MOSFETs play a key role in static power converters, where power MOSFETs operate at high
switching frequencies and are susceptible to Electromagnetic Interference (EMI) due to …

Open-switch fault detection in three-phase symmetrical cascaded multilevel inverter using conducted disturbances

I Abari, M Hamouda, JBH Slama - 2018 15th International Multi …, 2018 - ieeexplore.ieee.org
This paper proposes a fault detection approach for open-circuit faults in a seven-level
cascaded H-bridge (CHB) multilevel inverter. This method utilizes a simple three-phase …

First study on harvesting electromagnetic noise energy generated by the frequency converters

MH Raouadi, JP Fanton… - International Journal of …, 2023 - metrology-journal.org
This paper proposes a novel environmental energy harvesting process. The source of
energy consists of the electromagnetic (EM) noise emitted by the frequency converter …

Impact of layout on the conducted emissions of a DC-DC converter using numerical approach

W Belloumi, A Bréard, JBH Slama… - 2018 15th International …, 2018 - ieeexplore.ieee.org
This paper presents a comparative study between different buck converter layouts in order to
show its impact on conducted disturbances. Indeed, all the stray elements, such as resistive …

Experimental investigation on the evolution of a conducted-EMI buck converter after thermal aging tests of the MOSFET

S Douzi, M Tlig, JBH Slama - Microelectronics Reliability, 2015 - Elsevier
The electrical characteristics of semiconductors and especially the power components are
sensitive to temperature variation. Therefore, the thermal behaviour takes an essential place …

Experimental study on the EMI and switching time evolution of IGBT devices after operating aging tests

M Tlig, JBH Slama, MA Belaid - 2014 International Conference …, 2014 - ieeexplore.ieee.org
The IGBT is a critical device in the static converters, it is important to assess its reliability. In
this paper, we investigate the accelerated aging effect on the conducted EMI …

Radiated EMI evolution of power SiC MOSFET in a boost converter after short-circuit aging tests

S Douzi, M Kadi, H Boulzazen, M Tlig… - Microelectronics …, 2019 - Elsevier
Increasing power density, faster switching speed and higher switching frequency force
designers to spend more time both considering the effect of Electromagnetic Interferences …

Simulation of conducted EMI in SiC MOSFET buck converters before and after aging

S Douzi, M Tlig, JBH Slama… - 2016 7th International …, 2016 - ieeexplore.ieee.org
Because of switching conditions, the SiC MOSFET (Silicon Carbide MOSFET) always
remains a critical device in static converters. Its reliability is still a challenge which requires …

Conducted EMI evolution of power SiC MOSFET in a Buck converter after short-circuit aging tests

S Douzi, M Kadi, H Boulzazen, M Tlig… - Microelectronics …, 2018 - Elsevier
The electromagnetic compatibility (EMC) study is an indispensable step in the development
cycle of power system modules. In power applications using normally off transistors, short …