GenX is a versatile program using the differential evolution algorithm for fitting X-ray and
neutron reflectivity data. It utilizes the Parratt recursion formula for simulating specular …

The availability of reliable characterisation tools for carbon films down to a few atomic layers'
thickness is one of the most decisive factors for technology development and production. In …

We briefly review the active areas of current research in magnetic superlattices,
emphasizing later years. With recent widening use of advanced technologies, more …

Specular X-ray reflectivity (XRR) has been employed in the characterization of a novel
series of ZnO/Al2O3 multilayer materials prepared by atomic layer deposition in a custom …

We investigated the role of microstructure and Co layer thickness on the perpendicular
magnetic anisotropy of as-deposited and annealed Ta (5 nm)/[Co (t Co)/Au (2 nm)]× N= 20 …

With the extensive demands of high-flux beamlines for current or planned synchrotron
radiation sources, it is important to use multilayer monochromators for beamlines with …

The relationship between the interface structure and perpendicular anisotropy in sputtered
Co/Pd multilayers has been investigated using grazing incidence x-ray scattering and …

The functionality and reliability of nanoscale multilayer devices and components are
influenced by changes in stress and microstructure throughout fabrication, processing, and …

The structural properties of a tetragonally distorted Fe 1− x Co x alloy, in the form of Fe 1− x
Co x/Pt (001) superlattices with x= 0.64, have been investigated experimentally. The study …

B4C-based multilayers have important applications for soft to hard X-rays. In this paper, X-
ray grazing-incidence reflectivity and diffuse scattering, combining various analysis …