This review highlights recent efforts on applying electron microscopy (EM) to soft (including
biological) nanomaterials. We will show how developments of both the hardware and …

In the 20 years since precession electron diffraction (PED) was introduced, it has grown from
a little-known niche technique to one that is seen as a cornerstone of electron …

Scanning transmission electron microscopy (STEM) is widely used for imaging, diffraction,
and spectroscopy of materials down to atomic resolution. Recent advances in detector …

One of the founding concepts of the high-entropy alloy (HEA) field was that the lattice
structures of multicomponent solid solution phases are highly distorted. The displacement of …

Nanoscale strain mapping by four-dimensional scanning transmission electron microscopy
(4D-STEM) relies on determining the precise locations of Bragg-scattered electrons in a …

The last few years have seen a great deal of progress in the development of transmission
electron microscopy based techniques for strain mapping. New techniques have appeared …

Crystalline materials used in technological applications are often complex assemblies
composed of multiple phases and differently oriented grains. Robust identification of the …

Two approaches have been compared for the low temperature epitaxy of thick, partially
relaxed GeSn layers on top of Ge strain relaxed buffers. The benefit of using step-graded …

Scanning nanobeam electron diffraction strain mapping is a technique by which the
positions of diffracted disks sampled at the nanoscale over a crystalline sample can be used …

Scanning transmission electron microscopy (STEM) is one of the most powerful
characterization tools in materials science research. Due to instrumentation developments …