All-optical characterization of carrier lifetimes and diffusion lengths in MOCVD-, ELO-, and HVPE-grown GaN
T Malinauskas, R Aleksiejūnas, K Jarašiūnas… - Journal of crystal …, 2007 - Elsevier
The metrological capability of the picosecond four-wave mixing (FWM) technique for
evaluation of the photoelectrical properties of GaN heterostructures grown on sapphire …
evaluation of the photoelectrical properties of GaN heterostructures grown on sapphire …
The determination of high-density carrier plasma parameters in epitaxial layers, semi-insulating and heavily doped crystals of 4H-SiC by a picosecond four-wave …
K Neimontas, T Malinauskas… - Semiconductor …, 2006 - iopscience.iop.org
We applied a picosecond four-wave mixing technique for measurements of carrier lifetimes
and diffusion coefficients in highly excited epitaxial layers, semi-insulating and heavily …
and diffusion coefficients in highly excited epitaxial layers, semi-insulating and heavily …
Carrier transport and recombination in InGaN/GaN heterostructures, studied by optical four‐wave mixing technique
R Aleksiejūnas, M Sūdžius, V Gudelis… - … status solidi (c), 2003 - Wiley Online Library
Time‐resolved four‐wave mixing has been performed in InGaN/GaN/sapphire
heterostructures using picosecond pulses at 355 nm for carrier excitation. In‐plane diffusion …
heterostructures using picosecond pulses at 355 nm for carrier excitation. In‐plane diffusion …
Subgap time of flight: A spectroscopic study of deep levels in semi-insulating CdTe: Cl
We report on a study of deep levels in semi-insulating CdTe: Cl by means of a time-of-flight
spectral approach. By varying the wavelength of a pulsed optical source within the CdTe …
spectral approach. By varying the wavelength of a pulsed optical source within the CdTe …
Correlation between the low-temperature PL spectra and Cd0. 9Zn0. 1Te quality
G Li, X Zhang, W Jie - Semiconductor science and technology, 2004 - iopscience.iop.org
The low-temperature photoluminescence (PL) measurements revealed that Cd 0.9 Zn 0.1 Te
PL spectra consisted of three regions: the near-band-edge region with an emission peak I 0 …
PL spectra consisted of three regions: the near-band-edge region with an emission peak I 0 …
Light-induced dynamic gratings and photorefraction
HJ Eichler, A Hermerschmidt - … Materials and Their Applications 1: Basic …, 2006 - Springer
2.5 Conclusions Dynamic gratings can be induced by interfering laser beams in almost any
optical material. Some selected works related to laser-induced gratings have been used as …
optical material. Some selected works related to laser-induced gratings have been used as …
Hole spin surfaces in A3B5 semiconductors
A Dargys - physica status solidi (b), 2004 - Wiley Online Library
Abstract Properties of spin surfaces of heavy‐mass, light‐mass and split‐off bands of GaAs,
InAs, GaP, InP, GaSb, and InSb are presented under various approximations. A simple two …
InAs, GaP, InP, GaSb, and InSb are presented under various approximations. A simple two …
Evaluation of deep‐impurity governed photoelectrical properties in differently doped CdTe
We investigated nonequilibrium carrier generation, transport, and recombination processes
in differently doped bulk CdTe crystals by the contactless nonlinear optical technique–the …
in differently doped bulk CdTe crystals by the contactless nonlinear optical technique–the …
Visualizing Bulk-to-Surface Carrier Diffusion via Band-bending of Solar Cell Materials by 4D Electron Microscopy at Low Applied Potential
AM El-Zohry, B Shaheen, TG Allen, M De Bastiani… - 2023 - chemrxiv.org
Utilizing four-dimensional scanning ultrafast electron microscopy (4D-SUEM) is a powerful
tool to monitor charge dynamics at material surfaces and interfaces especially for the …
tool to monitor charge dynamics at material surfaces and interfaces especially for the …
Optical characterization of defect-related carrier recombination and transport features in GaN substrates and CVD diamonds
K Jarašiūnas, T Malinauskas… - Materials Science …, 2009 - Trans Tech Publ
Defect related carrier recombination and transport properties have been investigated in
differently doped HVPE GaN substrates and CVD diamond layers. Carrier generation by …
differently doped HVPE GaN substrates and CVD diamond layers. Carrier generation by …