The radiation environment in space has severe adverse effects on electronic systems. To
evaluate radiation sensitivity, electronics are tested on earth with different types of irradiation …

Advances in microelectronics performance and density continue to be fueled by the engine
of Moore's law. Although lately this engine appears to be running out of steam, recent …

An overview is presented of the significant influences of Moore's Law scaling on radiation
effects on microelectronics, focusing on historical trends and future needs. A number of …

This book introduces the basic concepts necessary to understand Single Event phenomena
which could cause random performance errors and catastrophic failures to electronics …

The history of integrated circuit (IC) development is another record of human challenges
involving space. Efforts have been made to protect ICs from sudden malfunctions due to …

In this paper, we describe a Monte Carlo approach for estimating the frequency and
character of single event effects based on a combination of physical modeling of discrete …

This document describes the radiation environments, physical mechanisms, and test
philosophies that underpin radiation hardness assurance test methodologies. The natural …

Direct ionization from low energy protons is shown to cause upsets in a 65-nm bulk CMOS
SRAM, consistent with results reported for other deep submicron technologies. The …

Increased space system performance is enabled by access to high-performance, low-power
radiation-hardened microelectronic components. While high performance can be achieved …

A novel mechanism for upset is seen in a commercially available 0.25/spl mu/m 10-T SEE
hardened SRAM cell. Unlike traditional multiple node charge collection in which diffusions …