High temperature nanoindentation: The state of the art and future challenges

JM Wheeler, DEJ Armstrong, W Heinz… - Current Opinion in Solid …, 2015 - Elsevier
Nanoindentation measurement capabilities at elevated temperatures have developed
considerably over the last two decades. Commercially available systems can now perform …

A new technique for producing large-area as-deposited zero-stress LPCVD polysilicon films: The multipoly process

J Yang, H Kahn, AQ He, SM Phillips… - Journal of …, 2000 - ieeexplore.ieee.org
Polysilicon films deposited by low-pressure chemical vapor deposition (LPCVD) exhibit
tensile or compressive residual stresses, depending on the deposition temperature …

A hot tip: imaging phenomena using in situ multi-stimulus probes at high temperatures

SS Nonnenmann - Nanoscale, 2016 - pubs.rsc.org
Accurate high temperature characterization of materials remains a critical challenge to the
continued advancement of various important energy, nuclear, electronic, and aerospace …

[HTML][HTML] High temperature surface imaging using atomic force microscopy

J Broekmaat, A Brinkman, DHA Blank… - Applied physics …, 2008 - pubs.aip.org
Atomic force microscopy (AFM) is one of the most important tools in nanotechnology and
surface science. Because of recent developments, nowadays, it is also used to study …

Analyzing the surface temperature depression in hot stage atomic force microscopy with unheated cantilevers: application to the crystallization of poly (ethylene oxide)

H Schönherr, LE Bailey, CW Frank - Langmuir, 2002 - ACS Publications
The in situ study of phase transitions in polymers by real-time atomic force microscopy (AFM)
has received much attention recently. In this paper we report on the accuracy of surface …

Scanning probe microscopy at 650° C in air

KV Hansen, T Jacobsen, AM Nørgaard… - … and Solid-State …, 2009 - iopscience.iop.org
The controlled atmosphere high temperature scanning probe microscope was designed to
study the electrical properties of surfaces at elevated temperatures by using the probe as an …

Thermal-induced recovery of small deformations and degradation defects on epoxy coating surface

X Shi, SG Croll - Journal of coatings technology and research, 2010 - Springer
Surface defects, which are dependent on the surface properties, determine the appearance,
toughness, and other properties of coatings; thus, changes to the morphology of a damaged …

Miniature environmental chamber enabling in situ scanning probe microscopy within reactive environments

SS Nonnenmann, DA Bonnell - Review of Scientific Instruments, 2013 - pubs.aip.org
Developments in solid oxide fuel cells (SOFCs) continue to be one of the most intensely
studied areas involving energy-producing systems, in an attempt to partially alleviate rapidly …

Impedance measurements on Au microelectrodes using controlled atmosphere high temperature scanning probe microscope

Y Wu, KV Hansen, T Jacobsen, M Mogensen - Solid State Ionics, 2011 - Elsevier
High temperature impedance measurements on Au microelectrodes deposited on polished
yttria stabilized zirconia (YSZ) pellets were demonstrated using a newly designed controlled …

Variable temperature fluid stage for atomic force microscopy

RK Workman, S Manne - Review of Scientific Instruments, 2000 - pubs.aip.org
The design of a simple, variable temperature fluid cell for an atomic force microscope is
presented. The stage is based on a thermoelectric heating/cooling element, which allows …