Heterogeneous integration of compound semiconductors

O Moutanabbir, U Gösele - Annual Review of Materials …, 2010 - annualreviews.org
The ability to tailor compound semiconductors and to integrate them onto foreign substrates
can lead to superior or novel functionalities with a potential impact on various areas in …

Advances in ion beam modification of semiconductors

RG Elliman, JS Williams - Current Opinion in Solid State and Materials …, 2015 - Elsevier
This review provides an overview of the current status of ion-implantation research in silicon,
germanium and the compound semiconductors SiC, GaN and ZnO. The discussion of silicon …

Wafer-Scale Fabrication of 42° Rotated Y-Cut LiTaO3-on-Insulator (LTOI) Substrate for a SAW Resonator

Y Yan, K Huang, H Zhou, X Zhao, W Li… - ACS Applied …, 2019 - ACS Publications
A high-performance filter is the key component in 5G communication. A surface acoustic
wave (SAW) resonator fabricated on a piezoelectric thin film instead of piezoelectric bulk …

Vacancy‐type defects and their annealing behaviors in Mg‐implanted GaN studied by a monoenergetic positron beam

A Uedono, S Takashima, M Edo, K Ueno… - … status solidi (b), 2015 - Wiley Online Library
Vacancy‐type defects in Mg‐implanted GaN were probed using a monoenergetic positron
beam. Mg ions of multiple energies (15–180 keV) were implanted to provide a 200‐nm …

Annealing behavior of vacancy‐type defects in Mg‐and H‐implanted GaN studied using monoenergetic positron beams

A Uedono, H Iguchi, T Narita, K Kataoka… - … status solidi (b), 2019 - Wiley Online Library
Vacancy‐type defects in Mg‐implanted GaN with and without hydrogen (H) implantation are
probed by using monoenergetic positron beams. Mg+ and H+ ions are implanted into GaN …

Defect evolution in GaN thin film heterogeneously integrated with CMOS-compatible Si (100) substrate by ion-cutting technology

H Shi, A Yi, J Ding, X Liu, Q Qin, J Yi, J Hu… - Science China …, 2023 - Springer
Conclusion The defects and their thermo-evolution in the hetero-integrated GaN films on Si
(100) substrate were thoroughly studied. The nano-cavity defects and residual H ions in the …

The phenomenology of ion implantation-induced blistering and thin-layer splitting in compound semiconductors

R Singh, SH Christiansen, O Moutanabbir… - Journal of electronic …, 2010 - Springer
Hydrogen and/or helium implantation-induced surface blistering and layer splitting in
compound semiconductors such as InP, GaAs, GaN, AlN, and ZnO are discussed. The …

Vacancies and electron trapping centers in acidic ammonothermal GaN probed by a monoenergetic positron beam

A Uedono, Y Tsukada, Y Mikawa, T Mochizuki… - Journal of Crystal …, 2016 - Elsevier
Defects in ammonothermal GaN have been studied using a monoenergetic positron beam.
Through measurements of Doppler broadening spectra of the annihilation radiation, the …

Transfer of III-nitride epitaxial layers onto pre-patterned silicon substrates for the simple fabrication of free-standing MEMS

R Gujrati, A Kassem, C Ayela, F Mathieu, L Nicu… - Applied Physics …, 2024 - pubs.aip.org
In recent years, the remarkable properties and potential applications of III-nitride (III-N)
semiconductors have sparked a significant interest in the field of microelectromechanical …

Lattice disorder and N elemental segregation in ion implanted GaN epilayer

BS Li, HP Liu, LJ Xu, J Wang, J Song, DP Peng… - Applied Surface …, 2020 - Elsevier
The lattice disorder and elemental distribution in He-implanted GaN epilayer at a fluence of
4× 10 16 He+/cm 2 at 450° C have been investigated by a combination of conventional, high …