Quantitative estimation of shunt resistance in crystalline silicon photovoltaic modules by electroluminescence imaging

S Roy, R Gupta - IEEE Journal of Photovoltaics, 2019 - ieeexplore.ieee.org
Ohmic shunts in crystalline silicon (c-Si) solar cells and modules are of critical concern as
these affect the open-circuit voltage, fill factor, and the net output power. In modules, such …

[PDF][PDF] Application of infrared thermography for non-destructive inspection of solar photovoltaic module

S Kumar, P Jena, A Sinha, R Gupta - J. Non Destr. Test. Eval, 2017 - researchgate.net
Infrared thermography (IR) is fast emerging as a popular non-destructive technique for the
detection and characterization of variety of defects and degradation in the solar photovoltaic …

Influence of local shunting on the electrical performance in industrial Silicon solar cells

P Somasundaran, R Gupta - Solar energy, 2016 - Elsevier
The paper presents the results of investigation on the influence of an ohmic shunt located at
various spatial positions on the solar cell performance by distributed diode model based …

Impact Analysis of Potential Induced Degradation on Crystalline Silicon Solar Cell Performance by Correlating Practical Diagnosis with MATLAB Simulation

AAQ Hasan, AA Alkahtani, MA Islam, YA Alsariera… - Materials, 2022 - mdpi.com
Extensive research on fault diagnosis is essential to detect various faults that occur to
different photovoltaic (PV) panels to keep PV systems operating at peak performance. Here …

Evaluation of shunt losses in industrial silicon solar cells

P Somasundaran, R Gupta - International Journal of …, 2016 - Wiley Online Library
Shunting is one of the key issues in industrial silicon solar cells which degrade cell
performance. This paper presents an approach for investigation of the performance …

Non-destructive approach for severity investigation of shunts in crystalline silicon photovoltaic modules by combination of electroluminescence imaging and lock-in …

S Roy, R Gupta - Measurement Science and Technology, 2019 - iopscience.iop.org
The characterization of localized shunts in photovoltaic (PV) modules is of major concern
due to its impact on the performance and reliability of the modules. Generally, lock-in …

Impact of partial shading on the performance and reliability of potential-induced degraded crystalline silicon PV module

R Kumar, VE Puranik, R Gupta - Journal of Renewable and …, 2024 - pubs.aip.org
Potential-induced degradation shunting (PID-s) is a severe degradation mechanism that
significantly impacts the performance and lifespan of photovoltaic (PV) modules. The impact …

[PDF][PDF] Characterization of degradation under standard environmental testing methods for crystalline silicon photovoltaic modules

S Kumar, S Roy, R Gupta - Int. J. Power Energy Res., 2017 - academia.edu
Standard environmental tests have been developed for photovoltaic (PV) modules to assess
the reliability of their performance in a short period of time. These tests generate different …

Thermal and electrical investigation of the reverse bias degradation of silicon solar cells

A Compagnin, M Meneghini, M Barbato… - Microelectronics …, 2013 - Elsevier
This work presents a detailed analysis of the degradation of Si-based solar cells submitted
to reverse-bias stress; the study is based on electrical, electro-optical and thermal …

Modeling and Performance Evaluation of Solar Cells Using IV curve Analysis

AAQ Hasan, AA Alkahtani, N Amin - International Conference on Emerging …, 2022 - Springer
The global photovoltaic (PV) capacity has expanded considerably, especially in buildings
and power plants that are stand-alone or grid-connected PV systems. Further research into …