Atomic and molecular layer deposition: off the beaten track

H Van Bui, F Grillo, JR Van Ommen - Chemical Communications, 2017 - pubs.rsc.org
Atomic layer deposition (ALD) is a gas-phase deposition technique that, by relying on self-
terminating surface chemistry, enables the control of the amount of deposited material down …

Thin film encapsulation for the organic light-emitting diodes display via atomic layer deposition

Y Li, Y Xiong, H Yang, K Cao, R Chen - Journal of Materials …, 2020 - cambridge.org
Organic light-emitting diodes (OLEDs) have aroused great attention due to the advantages
of high luminescent efficiency, fast response time, wide viewing angle, and the compatibility …

High‐speed and low‐energy nitride memristors

BJ Choi, AC Torrezan, JP Strachan… - Advanced Functional …, 2016 - Wiley Online Library
High‐performance memristors based on AlN films have been demonstrated, which exhibit
ultrafast ON/OFF switching times (≈ 85 ps for microdevices with waveguide) and relatively …

Vacuum-ultraviolet photovoltaic detector

W Zheng, R Lin, J Ran, Z Zhang, X Ji, F Huang - Acs Nano, 2018 - ACS Publications
Over the past two decades, solar-and astrophysicists and material scientists have been
researching and developing new-generation semiconductor-based vacuum ultraviolet …

Methods for depositing Group 13 metal or metalloid nitride films

X Lei, M Kim, SV Ivanov - US Patent 10,745,808, 2020 - Google Patents
Described herein are methods for forming a Group 13 metal or metalloid nitride film. In one
aspect, there is provided a method of forming an aluminum nitride film comprising the steps …

Hollow cathode plasma-assisted atomic layer deposition of crystalline AlN, GaN and Al x Ga 1− x N thin films at low temperatures

C Ozgit-Akgun, E Goldenberg, AK Okyay… - Journal of Materials …, 2014 - pubs.rsc.org
The authors report on the use of hollow cathode plasma for low-temperature plasma-
assisted atomic layer deposition (PA-ALD) of crystalline AlN, GaN and AlxGa1− xN thin films …

[HTML][HTML] Investigation and review of the thermal, mechanical, electrical, optical, and structural properties of atomic layer deposited high-k dielectrics: Beryllium oxide …

JT Gaskins, PE Hopkins, DR Merrill… - ECS Journal of Solid …, 2017 - iopscience.iop.org
Atomic layer deposited (ALD) high-dielectric-constant (high-k) materials have found
extensive applications in a variety of electronic, optical, optoelectronic, and photovoltaic …

[HTML][HTML] Low-temperature atomic layer epitaxy of AlN ultrathin films by layer-by-layer, in-situ atomic layer annealing

HY Shih, WH Lee, WC Kao, YC Chuang, RM Lin… - Scientific reports, 2017 - nature.com
Low-temperature epitaxial growth of AlN ultrathin films was realized by atomic layer
deposition (ALD) together with the layer-by-layer, in-situ atomic layer annealing (ALA) …

Structural and optical characterization of low-temperature ALD crystalline AlN

P Motamedi, K Cadien - Journal of Crystal Growth, 2015 - Elsevier
A plasma enhanced atomic layer deposition (PEALD) process has been used to deposit
crystalline AlN thin films at 250° C using nitrogen 5% hydrogen plasma and …

Atomic layer deposition: an enabling technology for the growth of functional nanoscale semiconductors

N Biyikli, A Haider - Semiconductor Science and Technology, 2017 - iopscience.iop.org
In this paper, we present the progress in the growth of nanoscale semiconductors grown via
atomic layer deposition (ALD). After the adoption by semiconductor chip industry, ALD …