The security of capacitive touchscreens is crucial since they have become the primary
human-machine interface on smart devices. To the best of our knowledge, this paper …

The security of capacitive touchscreens is crucial since they have become the primary
human-machine interface on smart devices. This paper presents Marionette, the first wired …

Voltage noise and operation errors in an integrated circuit (IC) due to electrostatic discharge
(ESD) events were measured, validated, and analyzed in this paper. A simplified structure of …

Electrostatic discharge (ESD)-induced soft failures are a critical issue for electronic systems
as the failures are mostly found after the hardware design is completed. Any changes …

Correlation between near-field EMI scan and ESD susceptibility scan of a cellphone CPU IC
is investigated. It is shown that the ESD susceptibility of the CPU IC depends on the activity …

The objective of this work is to identify electrostatic discharge (ESD) related soft failure
mechanisms early in the product life cycle. We compare different methods of injecting ESD …

An analysis methodology is presented to investigate soft failures in electronic devices. This
methodology combines transmission line pulse (TLP) full-wave simulations with system …

Electrostatic discharge (ESD) into a functioning system can cause temporary upsets–soft
failures. Subtle soft failures can reduce the reliability of system and cannot be detected by …

In this paper, we present a methodology to characterize the I/O pins of a logic IC such as an
application processor or ASIC with respect to soft-failure susceptibility due to electrostatic …

A fully automated system is developed for the systematic characterization of soft failure
robustness for a DUT. The methodology is founded on software-based detection methods …