Structural characterization of polycrystalline thin films by X-ray diffraction techniques
X-ray diffraction (XRD) techniques are powerful, non-destructive characterization tool with
minimal sample preparation. XRD provides the first information about the materials phases …
minimal sample preparation. XRD provides the first information about the materials phases …
Overview of residual stress in MEMS structures: Its origin, measurement, and control
Micro-electro-mechanical system (MEMS) technology has radically changed the scale,
performance, and cost of a wide variety of sensors and actuators by taking advantage of …
performance, and cost of a wide variety of sensors and actuators by taking advantage of …
The influence of multilayer structure on mechanical behavior of TiN/TiAlSiN multilayer coating
H Ma, Q Miao, G Zhang, W Liang, Y Wang, Z Sun… - Ceramics …, 2021 - Elsevier
Nitride coatings have been generally applied on light alloys like titanium and aluminium to
promote their multiple performances, including hardness, thermal stability and wear …
promote their multiple performances, including hardness, thermal stability and wear …
High-quality c-axis oriented Al (Sc) N thin films prepared by magnetron sputtering
M Wang, H Bo, A Wang, Z Cheng, S Li, W Zou, J He… - Thin Solid Films, 2023 - Elsevier
In order to adapt to the upgrading of wireless communication system, thin film bulk acoustic
resonator (FBAR) has become one of the research hotspots in the communication field. The …
resonator (FBAR) has become one of the research hotspots in the communication field. The …
Predicting residual stress of aluminum nitride thin-film by incorporating manifold learning and tree-based ensemble classifier
HF Chen, YP Yang, WL Chen, PJ Wang, W Lai… - Materials Chemistry and …, 2023 - Elsevier
The optical emission spectroscopy (OES) data provide multi-featured and high-dimension
data, which exhibit rich physical phenomena. The novel unsupervised learning uniform …
data, which exhibit rich physical phenomena. The novel unsupervised learning uniform …
[HTML][HTML] Stress engineering of polycrystalline aluminum nitride thin films for strain sensing with resonant piezoelectric microbridges
M Schlögl, J Weißenbach, M Schneider… - Sensors and Actuators A …, 2023 - Elsevier
For an optimized performance of micro electromechanical systems (MEMS) double-clamped
bridge-type resonators for mechanical strain sensing, a modified sputter process was …
bridge-type resonators for mechanical strain sensing, a modified sputter process was …
A systematic review of reliability issues in RF-MEMS switches
The main challenge in the commercialization of the RF-MEMS switches is their reliability,
related to both the electrical and mechanical domains. The development of test standards …
related to both the electrical and mechanical domains. The development of test standards …
Growth assessment and scrutinize dielectric reliability of c-axis oriented insulating AlN thin films in MIM structures for microelectronics applications
The present study reports the effect of bottom electrodes (Al, Pt & Ti) on the texture,
piezoelectric characteristics, dielectric properties and leakage current behavior of reactive …
piezoelectric characteristics, dielectric properties and leakage current behavior of reactive …
Effect of nitrogen flow ratio on the structure and optical properties of AlN film
X Jiang, Y Wu, J Qi, Y Liu, Y Wang, J Gao, H Hei, S Yu - Vacuum, 2024 - Elsevier
Aluminum nitride (AlN) films with different optical properties were prepared by radio
frequency (RF) reactive magnetron sputtering technique under different nitrogen (N 2) flow …
frequency (RF) reactive magnetron sputtering technique under different nitrogen (N 2) flow …
Growth and comparison of residual stress of AlN films on silicon (100),(110) and (111) substrates
This paper reports on the comparison of residual stresses in AlN thin films sputter-deposited
in identical conditions on Si (100)(110) and (111) substrates. The deposited films are of …
in identical conditions on Si (100)(110) and (111) substrates. The deposited films are of …