[图书][B] Copper wire bonding

PS Chauhan, A Choubey, ZW Zhong, MG Pecht… - 2014 - Springer
Chapter 1 gives an introduction to Cu wire bonding technology. The advantages of Cu over
Au, such as lower cost, higher mechanical strength, and higher electrical and thermal …

Design and fabrication of fine-pitch pixelated-addressed micro-LED arrays on printed circuit board for display and communication applications

D Peng, K Zhang, Z Liu - IEEE Journal of the Electron Devices …, 2016 - ieeexplore.ieee.org
In this paper, we report the design and fabrication of fine-pitch and pixelated-addressed
micro-light emitting diode (LED) arrays with emission wavelengths of red (R), green (G), blue …

Interfacial microstructures and thermodynamics of thermosonic Cu-wire bonding

J Li, L Liu, L Deng, B Ma, F Wang… - IEEE Electron Device …, 2011 - ieeexplore.ieee.org
The interfacial microstructures of the Cu-wire bonding to an Al pad are investigated first by
using an X-ray microdiffractometer and high-resolution transmission electron microscopy. It …

Dynamics features of Cu-wire bonding during overhang bonding process

L Junhui, L Linggang, M Bangke… - IEEE Electron Device …, 2011 - ieeexplore.ieee.org
Cu-wire overhang bonding process is investigated first by a high-speed camera system. It
was found that the greater impact, rebound, and deflection of overhang die during the Cu …

Interfacial characteristics and dynamic process of Au-and Cu-wire bonding and overhang bonding in microelectronics packaging

J Li, X Zhang, L Liu, L Han - Journal of microelectromechanical …, 2012 - ieeexplore.ieee.org
Microstructure characteristics of Cu-wire bonding interface are investigated first by using the
X-ray microdiffractometer, and the dynamic process of Cu-and Au-wire overhang bonding is …

Dislocation assisted diffusion: a mechanism for growth of intermetallic compounds in copper ball bonds

M Gholamirad, S Soltani, P Sepehrband - Microelectronics Reliability, 2018 - Elsevier
A combination of Finite Element Analysis (FEA), Molecular Dynamics (MD) simulation and
analytical formulation is employed to predict the thickness of Intermetallic Compounds …

Microstructural evaluation and failure analysis of Ag wire bonded to Al pads

MR Choi, HG Kim, TW Lee, YJ Jeon, YK Ahn… - Microelectronics …, 2015 - Elsevier
We found the failure mechanisms in Ag wire bonded to Al pads during the high-temperature-
storage lifetime test (HTST) and the unbiased highly-accelerated temperature and humidity …

Effect of welding parameters on resistance thermocompression microwelded joint of insulated copper wire

Z Cui, Y Li, L Chen, S Wen, S Guo - Welding in the World, 2021 - Springer
Insulated copper wire has been widely used in many industries, but the insulating coating
must be removed before welding because it will hinder the formation of joints. Therefore, in …

Die attach materials impacts to copper wire bonding: New challenges

LF Yee, CLW Yew - 2012 IEEE 14th Electronics Packaging …, 2012 - ieeexplore.ieee.org
Copper wire bond remains a challenge especially on bond pads with sensitive pad
metallization. Extensive work and analysis are needed at the onset of the packaging …

Development of advanced wire bonding technology for QFN devices

H Xu, A Rezvani, J Brunner, J Foley… - 2015 IEEE 65th …, 2015 - ieeexplore.ieee.org
Quad Flat No-Lead (QFN) is one of the fastest growing semiconductor packages. It offers a
variety of advantages including near-chip scale footprint, reduced lead inductance, thin …