A Ku-band eight-element phased-array transmitter with built-in self-test capability in 180-nm CMOS technology
Y Yu, D Chen, X Zhang, C Zhao, H Liu… - … Transactions on Very …, 2022 - ieeexplore.ieee.org
In this article, a CMOS Ku-band phased-array transmitter with eight elements is
demonstrated. To mitigate the measurement time and complexity, a built-in self-test (BIST) …
demonstrated. To mitigate the measurement time and complexity, a built-in self-test (BIST) …
Differential-mode power detection for built-in self-test of SiGe automotive radar transceiver front ends
Y Wenger, HJ Ng, F Korndörfer… - IEEE Transactions …, 2024 - ieeexplore.ieee.org
Recently, the feasibility of differential-mode power detection for built-in self-test (BIST) in
millimeter-wave SiGe transceiver front ends has been demonstrated. In this work, a system …
millimeter-wave SiGe transceiver front ends has been demonstrated. In this work, a system …
A nonintrusive machine learning-based test methodology for millimeter-wave integrated circuits
F Cilici, MJ Barragan, E Lauga-Larroze… - IEEE Transactions …, 2020 - ieeexplore.ieee.org
In this article, we leverage the power of machine learning algorithms to propose a test
methodology for millimeter-wave (mm-wave) integrated circuits. The proposed test strategy …
methodology for millimeter-wave (mm-wave) integrated circuits. The proposed test strategy …
Built-In Self-Test of Millimeter-Wave Integrated Front-End Circuits: How Far Have We Come?
With automotive radar and 5G/6G communications, mass-market applications for millimeter-
wave circuits in silicon technologies have been identified or established in recent years. For …
wave circuits in silicon technologies have been identified or established in recent years. For …
Built-in test of millimeter-wave circuits based on non-intrusive sensors
A Dimakos, HG Stratigopoulos… - … , Automation & Test …, 2016 - ieeexplore.ieee.org
This paper addresses the high-volume production test problem for millimeter-wave (mm-
Wave) circuits. Bit error rate testing is the only feasible solution nowadays for mm-Wave …
Wave) circuits. Bit error rate testing is the only feasible solution nowadays for mm-Wave …
Utilizing SiGe HBT power detectors for sensing single-event transients in RF circuits
This paper demonstrates the use of an RF power detector to sense the occurrence of single-
event transients (SETs) in RF circuits and systems. The detector was connected to a low …
event transients (SETs) in RF circuits and systems. The detector was connected to a low …
A W-band SiGe transceiver with built-in self-test
S Zeinolabedinzadeh, AC Ulusoy… - 2019 IEEE 19th …, 2019 - ieeexplore.ieee.org
A fully integrated W-band silicon-germanium (SiGe) transceiver is presented which provides
a loop-back built-in self-test (BIST) functionality that allows continuous monitoring of the …
a loop-back built-in self-test (BIST) functionality that allows continuous monitoring of the …
Antenna device and method for calibrating antenna device
FY Kuo, CY Chiang, WC Chen - US Patent 10,469,183, 2019 - Google Patents
An antenna device and a method for calibrating an antenna device are provided, and the
method includes: transmitting or receiving a signal by a first antenna unit and a second …
method includes: transmitting or receiving a signal by a first antenna unit and a second …
[PDF][PDF] Millimeter-Wave Front-End Circuits for Wireless Communications
R Ahamed - 2023 - aaltodoc.aalto.fi
This thesis focuses on the design and characterization of millimeter-wave monolithic active
and passive circuits for 5G-and-beyond 5G communication systems. Specifically, this thesis …
and passive circuits for 5G-and-beyond 5G communication systems. Specifically, this thesis …
Development of Built-In Self-Test solutions for RF/mm-wave integrated circuits
F Cilici - 2019 - theses.hal.science
Recent silicon technologies are especially prone to imperfections during the fabrication of
the circuits. Process variations can induce a noticeable performance shift, especially for high …
the circuits. Process variations can induce a noticeable performance shift, especially for high …