Among the large variety of scanning probe microscopy techniques, noncontact atomic force
microscopy (NC-AFM) stands out with its capability of atomic-resolution imaging and …

Lateral-force microscopy is a powerful tool to study the frictional properties of two-
dimensional materials. However, few works distinctly reveal the correlation between the tip …

The effect of tip asymmetry on atomic-resolution scanning tunneling microscopy and atomic
force microscopy measurements of graphitic surfaces has been investigated via numerical …

In high-resolution scanning probe microscopy, it is becoming increasingly common to
simultaneously record multiple channels representing different tip–sample interactions to …

With recent advances in instrumentation and experimental methodology, noncontact atomic
force microscopy is now being frequently used to measure the atomic-scale interactions …

This chapter is dedicated to scanning probe microscopy (SPM) operated at cryogenic
temperatures, where the more fundamental aspects of phenomena important in the fields of …

Atomic force microscopy is a widely-used instrument in nanotechnology and nanoscience.
Imaging of single molecules, atoms or even bond structures and tip-sample interactions with …

In this paper, molecular dynamics simulations were performed to investigate the atomic-
scale imaging of a typical two-dimensional monolayer: molybdenum disulfide (MoS 2). With …

A molecular dynamics model is presented, which adds harmonic potentials to the atomic
interactions to mimic the elastic properties of an AFM cantilever. It gives new insight into the …