Review of silicon carbide power devices and their applications

X She, AQ Huang, O Lucia… - IEEE Transactions on …, 2017 - ieeexplore.ieee.org
Silicon carbide (SiC) power devices have been investigated extensively in the past two
decades, and there are many devices commercially available now. Owing to the intrinsic …

Current status and perspectives of ultrahigh-voltage SiC power devices

T Kimoto, Y Yonezawa - Materials Science in Semiconductor Processing, 2018 - Elsevier
Recent progress in the SiC material and ultrahigh-voltage devices is reviewed. Regarding
the material issues, fast epitaxial growth of high-purity epitaxial layers and reduction of basal …

Overview of high voltage SiC power semiconductor devices: Development and application

S Ji, Z Zhang, F Wang - CES Transactions on Electrical …, 2017 - ieeexplore.ieee.org
Research on high voltage (HV) silicon carbide (SiC) power semiconductor devices has
attracted much attention in recent years. This paper overviews the development and status …

Design and fabrication of GaN pn junction diodes with negative beveled-mesa termination

T Maeda, T Narita, H Ueda… - IEEE Electron …, 2019 - ieeexplore.ieee.org
We report on homoepitaxial GaN pn junction diodes with a negative beveled-mesa
termination. The electric field distribution in a beveled-mesa was investigated using TCAD …

Carrier lifetime and breakdown phenomena in SiC power device material

T Kimoto, H Niwa, T Okuda, E Saito… - Journal of Physics D …, 2018 - iopscience.iop.org
Recent progress and current understanding of carrier lifetimes and avalanche phenomena
in silicon carbide (SiC) are reviewed. The acceptor level of carbon vacancy (VC), called the …

Accurate analytical modeling for switching energy of PiN diodes reverse recovery

S Jahdi, O Alatise, L Ran… - IEEE Transactions on …, 2014 - ieeexplore.ieee.org
PiN diodes are known to significantly contribute to switching energy as a result of reverse-
recovery charge during turn-off. At high switching rates, the overlap between the high peak …

A multiple-ring-modulated JTE technique for 4H-SiC power device with improved JTE-dose window

X Deng, L Li, J Wu, C Li, W Chen, J Li… - IEEE Transactions on …, 2017 - ieeexplore.ieee.org
In this paper, a multiple-ring-modulated junction termination extension (MRM-JTE)
technology for large-area silicon carbide PiN rectifier rated at 4500 V is proposed and …

Highly enhanced inductive current sustaining capability and avalanche ruggedness in GaN pin diodes with shallow bevel termination

KW Nie, WZ Xu, FF Ren, D Zhou… - IEEE Electron …, 2020 - ieeexplore.ieee.org
In this work, small-angle beveled-mesa termination technique was developed in GaN pin
power diodes for high avalanche performances. With effective alleviation of electric field …

High-permittivity dielectric edge termination for vertical high voltage devices

HS Lee, NK Kalarickal, MW Rahman, Z Xia… - Journal of …, 2020 - Springer
A novel edge-termination concept using extreme permittivity dielectrics is proposed to
effectively manage electric fields in vertical power-devices. This method is expected to be …

A review of the etched terminal structure of a 4H-SiC PiN diode

H Zhou, J Yan, J Li, H Ge, T Zhu, B Zhang… - Journal of …, 2023 - iopscience.iop.org
The comparison of domestic and foreign studies has been utilized to extensively employ
junction termination extension (JTE) structures for power devices. However, achieving a …