Contacts between Two- and Three-Dimensional Materials: Ohmic, Schottky, and pn Heterojunctions

Y Xu, C Cheng, S Du, J Yang, B Yu, J Luo, W Yin, E Li… - ACS …, 2016 - ACS Publications
After a decade of intensive research on two-dimensional (2D) materials inspired by the
discovery of graphene, the field of 2D electronics has reached a stage with booming …

Nanoscale transport properties at silicon carbide interfaces

F Roccaforte, F Giannazzo… - Journal of Physics D …, 2010 - iopscience.iop.org
Wide bandgap semiconductors promise devices with performances not achievable using
silicon technology. Among them, silicon carbide (SiC) is considered the top-notch material …

MOCVD of AlN on epitaxial graphene at extreme temperatures

A Kakanakova-Georgieva, IG Ivanov… - …, 2021 - pubs.rsc.org
The initial stages of metal organic chemical vapor deposition (MOCVD) of AlN on epitaxial
graphene at temperatures in excess of 1200° C have been rationalized. The use of epitaxial …

[HTML][HTML] Modelling the inhomogeneous SiC Schottky interface

PM Gammon, A Pérez-Tomás, VA Shah… - Journal of Applied …, 2013 - pubs.aip.org
For the first time, the IVT dataset of a Schottky diode has been accurately modelled,
parameterised, and fully fit, incorporating the effects of interface inhomogeneity, patch pinch …

Electrical properties of the graphene/ (0001) interface probed by scanning current spectroscopy

S Sonde, F Giannazzo, V Raineri, R Yakimova… - Physical Review B …, 2009 - APS
The current transport across the graphene/4 H-SiC interface has been investigated with
nanometric lateral resolution by scanning current spectroscopy on both epitaxial graphene …

Temperature dependence of electrical characteristics of Pt/GaN Schottky diode fabricated by UHV e-beam evaporation

A Kumar, S Arafin, MC Amann, R Singh - Nanoscale research letters, 2013 - Springer
Temperature-dependent electrical characterization of Pt/n-GaN Schottky barrier diodes
prepared by ultra high vacuum evaporation has been done. Analysis has been made to …

Characterization technique for inhomogeneous 4H-SiC Schottky contacts: A practical model for high temperature behavior

G Brezeanu, G Pristavu, F Draghici, M Badila… - Journal of Applied …, 2017 - pubs.aip.org
In this paper, a characterization technique for 4H-SiC Schottky diodes with varying levels of
metal-semiconductor contact inhomogeneity is proposed. A macro-model, suitable for high …

Study of electrical characteristics of high quality Pt SBDs fabricated on HVPE-Grown β-Ga2O3 epilayers in a wide temperature range (80–525 K)

H Sheoran, JK Kaushik, R Singh - Materials Science in Semiconductor …, 2023 - Elsevier
In this study, we have experimentally investigated the temperature endurance capability of
high-quality Pt-based Schottky Barrier Diodes (SBDs) fabricated on halide vapor phase …

photodetection characteristics of Gold coated AfM tips and n-Silicon Substrate nano-Schottky interfaces

Y Abbas, A Rezk, F Alkindi, I Saadat, A Nayfeh… - Scientific reports, 2019 - nature.com
Silicon (Si)-based photodetectors are appealing candidates due to their low cost and
compatibility with the complementary metal oxide semiconductor (CMOS) technology. The …

Probing the uniformity of hydrogen intercalation in quasi-free-standing epitaxial graphene on SiC by micro-Raman mapping and conductive atomic force microscopy

F Giannazzo, I Shtepliuk, IG Ivanov, T Iakimov… - …, 2019 - iopscience.iop.org
In this paper, micro-Raman mapping and conductive atomic force microscopy (C-AFM) were
jointly applied to investigate the structural and electrical homogeneity of quasi-free-standing …