The rectenna device: From theory to practice (a review)

E Donchev, JS Pang, PM Gammon… - MRS Energy & …, 2014 - cambridge.org
This review article provides the state-of-art research and developments of the rectenna
device and its two main components–the antenna and the rectifier. Furthermore, the history …

[HTML][HTML] Influence of metal choice on (010) β-Ga2O3 Schottky diode properties

E Farzana, Z Zhang, PK Paul, AR Arehart… - Applied Physics …, 2017 - pubs.aip.org
A systematic study of Schottky barriers fabricated on (010) β-Ga 2 O 3 substrates is reported.
Schottky barrier heights (SBHs) and current transport modes were analyzed using a …

Nanoscale transport properties at silicon carbide interfaces

F Roccaforte, F Giannazzo… - Journal of Physics D …, 2010 - iopscience.iop.org
Wide bandgap semiconductors promise devices with performances not achievable using
silicon technology. Among them, silicon carbide (SiC) is considered the top-notch material …

Bionic visual-audio photodetectors with in-sensor perception and preprocessing

J Fu, C Nie, F Sun, G Li, H Shi, X Wei - Science Advances, 2024 - science.org
Serving as the “eyes” and “ears” of the Internet of Things, optical and acoustic sensors are
the fundamental components in hardware systems. Nowadays, mainstream hardware …

[HTML][HTML] Modelling the inhomogeneous SiC Schottky interface

PM Gammon, A Pérez-Tomás, VA Shah… - Journal of Applied …, 2013 - pubs.aip.org
For the first time, the IVT dataset of a Schottky diode has been accurately modelled,
parameterised, and fully fit, incorporating the effects of interface inhomogeneity, patch pinch …

Analysis of the AlGaN/GaN vertical bulk current on Si, sapphire, and free-standing GaN substrates

A Pérez-Tomás, A Fontserè, J Llobet… - Journal of Applied …, 2013 - pubs.aip.org
The vertical bulk (drain-bulk) current (I db) properties of analogous AlGaN/GaN hetero-
structures molecular beam epitaxially grown on silicon, sapphire, and free-standing GaN (FS …

Schottky contacts to silicon carbide: Physics, technology and applications

F Roccaforte, G Brezeanu, PM Gammon… - … Technology, I: Metal …, 2018 - books.google.com
Understanding the physics and technology of Schottky contacts to Silicon Carbide is
important, for both academic and industrial researchers. In fact, the rectifying contact is a tool …

Electrical evolution of W and WC Schottky contacts on 4H-SiC at different annealing temperatures

M Vivona, G Bellocchi, RL Nigro… - Semiconductor …, 2021 - iopscience.iop.org
In this paper, we investigate the electrical evolution of tungsten (W) and tungsten carbide
(WC) Schottky contacts on 4H-SiC subjected to thermal treatments at different annealing …

The Characteristic Parameters of Ni/n-6H-SiC Devices Over a Wide Measurement Temperature Range

K Ejderha, A Karabulut, N Turkan, A Turut - Silicon, 2017 - Springer
Abstract Ni/n-type 6H-SiC/Ni Schottky barrier diodes (SBDs) have been prepared by the DC
magnetron sputtering deposition technique. Their current-voltage characteristics (IV) have …

Barrier height tuning by inverse sputter etching at poly-Si/4H-SiC heterojunction diodes

F Triendl, G Pfusterschmied, S Schwarz… - Semiconductor …, 2021 - iopscience.iop.org
Si/4H-SiC heterojunction diodes (HJDs) are fabricated by applying Ar+ inverse sputter
etching (ISE) of the 4H-SiC substrate prior to Si deposition. A subsequent annealing step …