Synergistic effect of aminosilane and K2CO3 on improving Chemical Mechanical Polishing performance of SiO2 dielectric layer
Q Zhao, S Xie, H Wang, L Yang, X Mei, Y He - Materials Science in …, 2022 - Elsevier
Abstract Chemical Mechanical Polishing (CMP) is a widely used surface treatment process
in integrated circuit manufacturing for global planarization of the surface layers of various …
in integrated circuit manufacturing for global planarization of the surface layers of various …
Zeta potential-tunable silica abrasives and fluorinated surfactants in chemical mechanical polishing slurries
S Hong, D Han, KS Jang - Wear, 2021 - Elsevier
Chemical mechanical planarization (CMP) is a vital process for smoothing and polishing the
surfaces of various material layers in the semiconductor device fabrication. CMP slurries …
surfaces of various material layers in the semiconductor device fabrication. CMP slurries …
Investigation of the barrier slurry with better defect performance and facilitating post-CMP cleaning
X Luan, Y Liu, B Zhang, S Wang, X Niu, C Wang… - Microelectronic …, 2017 - Elsevier
It becomes very critical for yield enhancement to accomplish defect free global planarization
during barrier CMP. Conventional commercial barrier chemical mechanical polishing (CMP) …
during barrier CMP. Conventional commercial barrier chemical mechanical polishing (CMP) …
Surface action mechanism and design considerations for the mechanical integrity of Cu/Low K BEOL interconnect during chemical mechanical polishing process
S Wang, TJ Liu, F Dong, Y Sun, L Xue, R Li… - Microelectronics …, 2022 - Elsevier
Chemical mechanical planarization (CMP) is a high-precision and complex manufacturing
process during which materials are removed with chemical and mechanical actions to …
process during which materials are removed with chemical and mechanical actions to …
Model-based optimization of CMP process parameters for uniform material removal selectivity in Cu/barrier planarization
W Akbar, Ö Ertunç - ECS Journal of Solid State Science and …, 2022 - iopscience.iop.org
Chemical mechanical planarization is a process of achieving planar surfaces in the
semiconductor manufacturing industry. The planarization of a surface is achieved by …
semiconductor manufacturing industry. The planarization of a surface is achieved by …
Investigation of copper oxide ring formation during post chemical mechanical polishing cleaning of Cu interconnect
The formation of a ring-shaped residue after the chemical mechanical polishing (CMP)
process of a copper (Cu) interconnect was investigated. The chemical composition of the …
process of a copper (Cu) interconnect was investigated. The chemical composition of the …
An efficient and high quality chemical mechanical polishing method for copper surface in 3D TSV integration
Z Liu, Q Tian, J Li, X Liu, W Zhu - IEEE Transactions on …, 2019 - ieeexplore.ieee.org
The goal of chemical mechanical polishing (CMP) is to achieve a flat and smooth surface for
through silicon via (TSV) application. In order to obtain high efficiency and high quality …
through silicon via (TSV) application. In order to obtain high efficiency and high quality …
超滤和活性剂协同作用对铜阻挡层CMP 后缺陷的控制机理研究.
崔志慧, 王辰伟, 刘玉岭, 赵红东… - … Components & Materials, 2022 - search.ebscohost.com
在铜互连阻挡层化学机械抛光(CMP) 过程中, 由于工艺和材料等因素会产生划伤和沾污等缺陷
问题, 造成器件失效, 良率降低及潜在可靠性等问题. 研究了抛光液中活性剂及超滤工艺对CMP …
问题, 造成器件失效, 良率降低及潜在可靠性等问题. 研究了抛光液中活性剂及超滤工艺对CMP …
Reliability of Complete Plasma Etched Ru/Cu Lines
The reliability of oxygen plasma-etched ruthenium/copper thin film stacks was studied under
constant-current density and constant-voltage stress conditions. The thin ruthenium served …
constant-current density and constant-voltage stress conditions. The thin ruthenium served …
Mechanistic Study of Interfacial Reaction Dynamics Relevant to FEOL and BEOL Chemical Mechanical Planarization (CMP) Processes
KM Wortman-Otto - 2021 - search.proquest.com
Decoupling the key interfacial mechanisms (chemical and mechanical) present during
CuCMP is critical to the development of slurry/pad consumable sets to reduce defectivity at …
CuCMP is critical to the development of slurry/pad consumable sets to reduce defectivity at …