Fault modeling and worst case test vector generation for flash-based FPGAs exposed to total dose
AA Abou-Auf, MM Abdel-Aziz… - … on Nuclear Science, 2017 - ieeexplore.ieee.org
We analyzed the delay failure induced in flash-based field-programmable gate arrays
(FPGAs) exposed to total-ionizing dose. We developed a novel cell-level fault model for …
(FPGAs) exposed to total-ionizing dose. We developed a novel cell-level fault model for …
Fault modeling and worst-case test vectors of sequential ASICs exposed to total dose
AA Abou-Auf, MM Abdel-Aziz… - … on Nuclear Science, 2012 - ieeexplore.ieee.org
We introduce a novel methodology for identifying worst-case test vectors for sequential
circuits in ASIC devices exposed to total dose. Testing of sequential circuits requires the use …
circuits in ASIC devices exposed to total dose. Testing of sequential circuits requires the use …
Worst-case test vectors of FPGAs exposed to total dose
AA Abou-Auf, MM Abdel-Aziz… - 2016 16th European …, 2016 - ieeexplore.ieee.org
Worst-case test vectors of FPGAs exposed to total dose Page 1 Abstract—We introduce a novel
methodology for identifying the worst-case test vector for flash-based FPGA devices exposed …
methodology for identifying the worst-case test vector for flash-based FPGA devices exposed …
A comprehensive comparison between design for testability techniques for total dose testing of flash-based FPGAs
MA Ibrahim, MM Abdel-Aziz… - … on Nuclear Science, 2021 - ieeexplore.ieee.org
A comprehensive comparison between different design for testability (DFT) techniques for
total-ionizing-dose (TID) testing of flash-based field-programmable gate arrays (FPGAs) is …
total-ionizing-dose (TID) testing of flash-based field-programmable gate arrays (FPGAs) is …
Identifying worst case test vectors for FPGA exposed to total ionization dose using design for testability techniques
MS Abdelwahab - 2018 - fount.aucegypt.edu
Electronic devices often operate in harsh environments which contain a variation of radiation
sources. Radiation may cause different kinds of damage to proper operation of the devices …
sources. Radiation may cause different kinds of damage to proper operation of the devices …
Worst-case test vectors of sequential ASiCS exposed to total dose
AA Abou-Auf, MM Abdel-Aziz… - 2011 12th European …, 2011 - ieeexplore.ieee.org
We introduce a novel methodology for identifying worst-case test vectors for sequential
circuits in ASIC devices exposed to total dose. Testing of sequential circuits requires the use …
circuits in ASIC devices exposed to total dose. Testing of sequential circuits requires the use …