This work presents a low cost automatic test generation tool for structural analog testing.
With the spice netlist and technology models of the circuit to be tested, a fault list is …

This paper presents a novel multifunctional test structure called Analog BulLt-in Block
Observer (ABILBO). This structure is based on analog integrators and achieves analog scan …

The increasing importance of next generation test technology to provide high quality, low
cost fault detection methodologies is becoming a big issue in the microelectronics industry …

The test and diagnosis of fully differential analogue filters are addressed in this paper. Full
coverage of hard/soft faults affecting circuit behaviour can be achieved by adjusting the …

A comprehensive testability study on a commercial automatic gain control circuit is
presented which aims to identify design for testability (DfT) modifications to both reduce …

The cost and complexity of mixed signal and analogue production test programs is lending
to considerable interest in Design for testability (DfT) techniques that have the potential to …

The property of the Gaussian white noise that its auto-correlation is a single Dirac-δ function
is exploited in this paper. The testing scheme proposed uses a pseudorandom noise as the …

Based on fault simulation experiments with two microsystems, a resonant silicon beam force
sensor and a miniature opto-electric transformer, this paper demonstrates the necessity to …

Recent advances in technology are leading to increases in the complexity and applications
of analogue and mixed-signal integrated circuits. This trend has been accompanied by an …

Analog and mixed-signal circuits are gaining popularity in various applications such as
telecommunication, multimedia, biomedical applications and others. Testing of these circuits …