A review of capabilities and scope for hybrid integration offered by silicon-nitride-based photonic integrated circuits
In this review we present some of the recent advances in the field of silicon nitride photonic
integrated circuits. The review focuses on the material deposition techniques currently …
integrated circuits. The review focuses on the material deposition techniques currently …
[图书][B] Semiconductor nanocrystals and metal nanoparticles: physical properties and device applications
T Chen, Y Liu - 2016 - taylorfrancis.com
Semiconductor nanocrystals and metal nanoparticles are the building blocks of the next
generation of electronic, optoelectronic, and photonic devices. Covering this rapidly …
generation of electronic, optoelectronic, and photonic devices. Covering this rapidly …
Intense green-yellow electroluminescence from Tb+-implanted silicon-rich silicon nitride/oxide light emitting devices
Y Berencén, R Wutzler, L Rebohle, D Hiller… - Applied Physics …, 2013 - pubs.aip.org
High optical power density of 0.5 mW/cm 2, external quantum efficiency of 0.1%, and
population inversion of 7% are reported from Tb+-implanted silicon-rich silicon nitride/oxide …
population inversion of 7% are reported from Tb+-implanted silicon-rich silicon nitride/oxide …
Silicon nitride on Si: Electronic structure for flash memory devices
VA Gritsenko - Thin Films on Silicon: Electronic and Photonic …, 2017 - World Scientific
Amorphous silicon oxide SiO2 and amorphous silicon nitride Si3N4 are the two key
dielectrics in silicon electronics. Amorphous Si3N4 exhibits a memory effect due to its …
dielectrics in silicon electronics. Amorphous Si3N4 exhibits a memory effect due to its …
Bright red, orange-yellow and white switching photoluminescence from silicon oxynitride films with fast decay dynamics
Strong tunable photoluminescence (PL) from silicon oxynitride materials have been
demonstrated by modulating the oxygen content. The increase of oxygen content in the films …
demonstrated by modulating the oxygen content. The increase of oxygen content in the films …
Origin of strong white electroluminescence from dense Si nanodots embedded in silicon nitride
R Huang, J Song, X Wang, YQ Guo, C Song… - Optics letters, 2012 - opg.optica.org
Strong white electroluminescence (EL) from SiN-based devices containing Si nanodots with
a density of more than 4.6× 10^ 12/cm^ 2 was investigated. The white EL illustrates …
a density of more than 4.6× 10^ 12/cm^ 2 was investigated. The white EL illustrates …
Effect of barrier layers on electroluminescence from Si/SiOxNy multilayer structures
X Wang, R Huang, C Song, Y Guo, J Song - Applied Physics Letters, 2013 - pubs.aip.org
We report the effect of barrier layer on the electroluminescence from Si/SiO x N y multilayer
structures, where the SiO x N y barrier layers were modulated by varying the oxygen/nitride …
structures, where the SiO x N y barrier layers were modulated by varying the oxygen/nitride …
[HTML][HTML] Silicon nitride stoichiometry tuning for visible photonic integrated components
M Blasco, S Dacunha, C Dominguez… - Applied Physics …, 2024 - pubs.aip.org
In integrated photonics, silicon nitride-based devices operating in the visible range of light
may experience auto-fluorescence, an undesired effect that can interfere with the …
may experience auto-fluorescence, an undesired effect that can interfere with the …
Alignment control of self-assembling Si quantum dots
Y Imai, R Tsuji, K Makihara, N Taoka, A Ohta… - Materials Science in …, 2023 - Elsevier
We have demonstrated the formation of one-dimensionally aligned self-assembling silicon
quantum dots (Si-QDs) by low-pressure (LP) CVD using pure monosilane (SiH 4) gas …
quantum dots (Si-QDs) by low-pressure (LP) CVD using pure monosilane (SiH 4) gas …
Контактно-барьерные структуры субмикронной электроники
АП Достанко, НВ Богуш, СВ Бордусов… - 2021 - elibrary.ru
Рассмотрены и обобщены результаты исследований и разработок в области
формирования контактно-барьерных структур в изделиях субмикронной электроники и …
формирования контактно-барьерных структур в изделиях субмикронной электроники и …