[图书][B] Coplanar microwave integrated circuits
I Wolff - 2006 - books.google.com
The tools and techniques to fully leverage coplanar technology Coplanar Microwave
Integrated Circuits sets forth the theoretical underpinnings of coplanar waveguides and …
Integrated Circuits sets forth the theoretical underpinnings of coplanar waveguides and …
Electrooptic mapping and finite-element modeling of the near-field pattern of a microstrip patch antenna
K Yang, G David, JG Yook… - IEEE Transactions …, 2000 - ieeexplore.ieee.org
A comprehensive electrooptic field-mapping technique is applied to the characterization of
near-field radiation patterns above a microstrip patch antenna. The amplitude and phase …
near-field radiation patterns above a microstrip patch antenna. The amplitude and phase …
Calibration of electric coaxial near-field probes and applications
Y Gao, A Lauer, Q Ren, I Wolff - IEEE Transactions on …, 1998 - ieeexplore.ieee.org
A new calibration technique for application to near-field probes has been developed. For
this, a simple electric coaxial near-field probe for application in the 0.05-20-GHz band has …
this, a simple electric coaxial near-field probe for application in the 0.05-20-GHz band has …
Electrooptic mapping of near-field distributions in integrated microwave circuits
K Yang, G David, SV Robertson… - IEEE transactions on …, 1998 - ieeexplore.ieee.org
A field mapping system based on external electrooptic sampling has been developed in
order to determine the vectorial components of the electric near-field distribution within …
order to determine the vectorial components of the electric near-field distribution within …
An Electro-Optic Pulsed NVNA Load–Pull System for Distributed -Field Measurements
In this paper, a new combined electro-optic (EO) and pulsed nonlinear vector network
analyzer-based (NVNA) load-pull measurement system for distributed multiharmonic electric …
analyzer-based (NVNA) load-pull measurement system for distributed multiharmonic electric …
2D electro-optic probing combined with field theory based multimode wave amplitude extraction: a new approach to on-wafer measurement
G David, W Schroeder, D Jager… - Proceedings of 1995 …, 1995 - ieeexplore.ieee.org
A novel approach to on-wafer measurement is proposed, which combines the direct electro-
optic probing technique with a field theory based extraction technique for the modal voltages …
optic probing technique with a field theory based extraction technique for the modal voltages …
Two-dimensional mapping of amplitude and phase of microwave fields inside a MMIC using the direct electro-optic sampling technique
W Mertin, A Leyk, G David… - 1994 IEEE MTT-S …, 1994 - ieeexplore.ieee.org
For the first time, two-dimensional mappings representing both the amplitude and the phase
of microwave fields inside a traveling-wave amplifier (TWA) are presented. The direct electro …
of microwave fields inside a traveling-wave amplifier (TWA) are presented. The direct electro …
New aspects in electro-optic sampling
W Mertin - Microelectronic Engineering, 1996 - Elsevier
Nowadays, electro-optic sampling based on ultra-short optical pulses becomes more and
more attractive for microwave engineers developing monolithic microwave integrated …
more attractive for microwave engineers developing monolithic microwave integrated …
MMIC internal electric field mapping with submicrometre spatial resolution and gigahertz bandwidth by means of high frequency scanning force microscope testing
A Leyk, E Kubalek - Electronics Letters, 1995 - IET
High frequency scanning force microscope (HFSFM) testing enables, among other
measurements, the probing of device internal electric potential distributions within monolithic …
measurements, the probing of device internal electric potential distributions within monolithic …
Circuit-internal characterization of MMICs using two-dimensional electro-optic field mapping in combination with microwave CAD techniques
G David, R Tempel, A Ising, Y Kalayci… - 1994 24th European …, 1994 - ieeexplore.ieee.org
For the first time, distributions of microwave signals in an MMIC are measured by electro-
optic field mapping techniques and compared with results of microwave CAD. In good …
optic field mapping techniques and compared with results of microwave CAD. In good …