Comparative study of silicon-based ultraviolet photodetectors
L Shi, S Nihtianov - IEEE Sensors Journal, 2012 - ieeexplore.ieee.org
This review article presents a comparative study of different silicon-based ultraviolet (UV)
photodetector technologies. After a brief introduction and classification of UV photodetectors …
photodetector technologies. After a brief introduction and classification of UV photodetectors …
A highly ultraviolet light sensitive and highly robust image sensor technology based on flattened Si surface
R Kuroda, S Kawada, S Nasuno… - ITE Transactions on …, 2014 - jstage.jst.go.jp
In this paper, an ultraviolet light (UV-light) sensitive and highly robust Si photodiode
technology based on atomically flattened Si surface is summarized and its application to a …
technology based on atomically flattened Si surface is summarized and its application to a …
[图书][B] Detection of optical signals
A Rogalski, Z Bielecki - 2022 - books.google.com
Detection of Optical Signals provides a comprehensive overview of important technologies
for photon detection, from the X-ray through ultraviolet, visible, infrared to far-infrared …
for photon detection, from the X-ray through ultraviolet, visible, infrared to far-infrared …
Illuminated to dark ratio improvement in lateral SOI PIN photodiodes at high temperatures
This work presents a study of the illuminated to dark ratio (IDR) of lateral SOI PIN
photodiodes. Measurements performed on fabricated devices show a fivefold improvement …
photodiodes. Measurements performed on fabricated devices show a fivefold improvement …
Surface-charge-collection-enhanced high-sensitivity high-stability silicon photodiodes for DUV and VUV spectral ranges
L Shi, S Nihtianov, L Haspeslagh… - IEEE transactions on …, 2012 - ieeexplore.ieee.org
The electrical and optical performance of silicon pure-boron (Pure-B) diode is investigated in
relationship to the thermal processing used after formation of the PureB chemical-vapor …
relationship to the thermal processing used after formation of the PureB chemical-vapor …
A CMOS Image Sensor with 240 μV/e–Conversion Gain, 200 ke–Full Well Capacity, 190-1000 nm Spectral Response and High Robustness to UV light
S Nasuno, S Wakashima, F Kusuhara… - ITE Transactions on …, 2016 - jstage.jst.go.jp
The structure and performances of a CMOS image sensor fabricated by integrating
technologies in a series of process flow that achieve wide spectral response, high …
technologies in a series of process flow that achieve wide spectral response, high …
Stability characterization of high-sensitivity silicon-based EUV photodiodes in a detrimental environment
L Shi, S Nihtianov, LK Nanver… - IEEE Sensors Journal, 2012 - ieeexplore.ieee.org
In extreme-ultraviolet (EUV)-based applications, such as next-generation EUV lithography,
the detector surface has to be periodically exposed to aggressive gasses as a cleaning step …
the detector surface has to be periodically exposed to aggressive gasses as a cleaning step …
Interface Trap Effect on the n-Channel GaN Schottky Barrier-Metal–Oxide Semiconductor Field-Effect Transistor for Ultraviolet Optoelectronic Integration
BJ Park, HS Kim, SH Hahm - Nanomaterials, 2023 - mdpi.com
Ultraviolet (UV) photodetectors are key devices required in the industrial, military, space,
environmental, and biological fields. The Schottky barrier (SB)-MOSFET, with its high hole …
environmental, and biological fields. The Schottky barrier (SB)-MOSFET, with its high hole …
Photodiode dopant structure with atomically flat Si surface for high-sensitivity and stability to UV light
T Nakazawa, R Kuroda, Y Koda… - Sensors, Cameras, and …, 2012 - spiedigitallibrary.org
In this work, n+ pn-type photodiodes with various surface n+ layer profiles formed on the
atomically flat Si surface were evaluated to investigate the relationships between the surface …
atomically flat Si surface were evaluated to investigate the relationships between the surface …
AlGaN-on-Si-Based 10- Pixel-to-Pixel Pitch Hybrid Imagers for the EUV Range
PE Malinowski, JY Duboz, P De Moor… - IEEE electron device …, 2011 - ieeexplore.ieee.org
We report on the fabrication of extreme ultraviolet (EUV) hybrid imagers with backside-
illuminated detector chip based on aluminum gallium nitride (AlGaN) layers grown on silicon …
illuminated detector chip based on aluminum gallium nitride (AlGaN) layers grown on silicon …