Advanced processing for mobility improvement in 4H-SiC MOSFETs: A review

M Cabello, V Soler, G Rius, J Montserrat… - Materials Science in …, 2018 - Elsevier
This paper reviews advanced gate dielectric processes for SiC MOSFETs. The poor quality
of the SiO 2/SiC interface severely limits the value of the channel field-effect mobility …

High-k dielectrics for 4H-silicon carbide: present status and future perspectives

A Siddiqui, RY Khosa, M Usman - Journal of Materials Chemistry C, 2021 - pubs.rsc.org
Owing to its superior material and electrical properties such as wide bandgap and high
breakdown electric field, 4H-silicon carbide (4H-SiC) has shown promise in high power …

Low-temperature, high-performance solution-processed thin-film transistors with peroxo-zirconium oxide dielectric

JH Park, YB Yoo, KH Lee, WS Jang, JY Oh… - … applied materials & …, 2013 - ACS Publications
We demonstrated solution-processed thin film transistors on a peroxo-zirconium oxide
(ZrO2) dielectric with a maximum temperature of 350° C. The formation of ZrO2 films was …

Effects of drying temperature and ethanol concentration on bipolar switching characteristics of natural Aloe vera-based memory devices

ZX Lim, KY Cheong - Physical Chemistry Chemical Physics, 2015 - pubs.rsc.org
Extracted, formulated, and processed natural Aloe vera has been used as an active layer for
memory applications. The functional memory device is realized by a bottom-up structure of …

Interlayer transition in a vdW heterostructure toward ultrahigh detectivity shortwave infrared photodetectors

T Qi, Y Gong, A Li, X Ma, P Wang… - Advanced Functional …, 2020 - Wiley Online Library
Van der Waals (vdW) heterostructures of 2D atomically thin layered materials (2DLMs)
provide a unique platform for constructing optoelectronic devices by staking 2D atomic …

High-mobility and hysteresis-free flexible oxide thin-film transistors and circuits by using bilayer sol–gel gate dielectrics

JW Jo, KH Kim, J Kim, SG Ban, YH Kim… - ACS applied materials …, 2018 - ACS Publications
In this paper, we demonstrate high-performance and hysteresis-free solution-processed
indium–gallium–zinc oxide (IGZO) thin-film transistors (TFTs) and high-frequency-operating …

Resistive switching characteristics of Si3N4-based resistive-switching random-access memory cell with tunnel barrier for high density integration and low-power …

S Kim, S Jung, MH Kim, S Cho, BG Park - Applied Physics Letters, 2015 - pubs.aip.org
In this letter, a bipolar resistive-switching random-access memory (RRAM) in Ni/Si 3 N 4/SiO
2/p+-Si structure and its fabrication process are demonstrated. The proposed device with …

Structural and insulating behaviour of high-permittivity binary oxide thin films for silicon carbide and gallium nitride electronic devices

R Lo Nigro, P Fiorenza, G Greco, E Schilirò… - Materials, 2022 - mdpi.com
High-κ dielectrics are insulating materials with higher permittivity than silicon dioxide. These
materials have already found application in microelectronics, mainly as gate insulators or …

An Opto-Electronic HfOx-Based Transparent Memristive Synapse for Neuromorphic Computing System

A Saleem, D Kumar, F Wu, LB Keong… - IEEE Transactions on …, 2023 - ieeexplore.ieee.org
In this study, a transparent bilayer memristor showing both electrical and optical synapses
along with good electrical properties after annealing is presented. In addition to 85 …

Structural and electrical characteristics of RF-sputtered HfO2 high-k based MOS capacitors

PM Tirmali, AG Khairnar, BN Joshi, AM Mahajan - Solid-state electronics, 2011 - Elsevier
The HfO 2 high-k thin films have been deposited on p-type (1 0 0) silicon wafer using RF
magnetron sputtering technique. The XRD, AFM and Ellipsometric characterizations have …