A review of direct drive proportional electrohydraulic spool valves: industrial state-of-the-art and research advancements

P Tamburrano, AR Plummer… - Journal of …, 2019 - asmedigitalcollection.asme.org
This paper reviews the state of the art of directly driven proportional directional hydraulic
spool valves, which are widely used hydraulic components in the industrial and …

[HTML][HTML] 633-nm InGaN-based red LEDs grown on thick underlying GaN layers with reduced in-plane residual stress

D Iida, Z Zhuang, P Kirilenko, M Velazquez-Rizo… - Applied Physics …, 2020 - pubs.aip.org
This work investigates the influence of residual stress on the performance of InGaN-based
red light-emitting diodes (LEDs) by changing the thickness of the underlying n-GaN layers …

Thermal management and characterization of high-power wide-bandgap semiconductor electronic and photonic devices in automotive applications

SK Oh, JS Lundh, S Shervin… - Journal of …, 2019 - asmedigitalcollection.asme.org
GaN-based high-power wide-bandgap semiconductor electronics and photonics have been
considered as promising candidates to replace conventional devices for automotive …

Nanoscale electro-thermal interactions in AlGaN/GaN high electron mobility transistors

B Chatterjee, C Dundar, TE Beechem… - Journal of Applied …, 2020 - pubs.aip.org
Self-heating in AlGaN/GaN high electron mobility transistors (HEMTs) negatively impacts
device performance and reliability. Under nominal operating conditions, a hot-spot in the …

Thermal transport and mechanical stress mapping of a compression bonded GaN/diamond interface for vertical power devices

W Delmas, A Jarzembski, M Bahr… - … Applied Materials & …, 2024 - ACS Publications
Bonding diamond to the back side of gallium nitride (GaN) electronics has been shown to
improve thermal management in lateral devices; however, engineering challenges remain …

[HTML][HTML] Simultaneous measurement of temperature, stress, and electric field in GaN HEMTs with micro-Raman spectroscopy

KR Bagnall, EA Moore, SC Badescu, L Zhang… - Review of Scientific …, 2017 - pubs.aip.org
As semiconductor devices based on silicon reach their intrinsic material limits, compound
semiconductors, such as gallium nitride (GaN), are gaining increasing interest for high …

[HTML][HTML] Thermal characterization of gallium nitride pin diodes

J Dallas, G Pavlidis, B Chatterjee, JS Lundh… - Applied Physics …, 2018 - pubs.aip.org
In this study, various thermal characterization techniques and multi-physics modeling were
applied to understand the thermal characteristics of GaN vertical and quasi-vertical power …

Opportunities in single event effects in radiation-exposed SiC and GaN power electronics

SJ Pearton, A Haque, A Khachatrian… - ECS Journal of Solid …, 2021 - iopscience.iop.org
Radiation effects have a critical impact on the reliability of SiC and GaN power electronics
and must be understood for space and avionics applications involving exposure to various …

The impact of mechanical stress on the degradation of AlGaN/GaN high electron mobility transistors

S Choi, E Heller, D Dorsey, R Vetury… - Journal of Applied …, 2013 - pubs.aip.org
Coupled electro-thermo-mechanical simulation and Raman thermometry were utilized to
analyze the evolution of mechanical stress in AlGaN/GaN high electron mobility transistors …

Physics and technology of gallium nitride materials for power electronics

F Roccaforte, P Fiorenza, R Lo Nigro… - La Rivista del Nuovo …, 2018 - Springer
Owing to its exceptional physical and electronic properties, gallium nitride (GaN) is a
promising material that can find application in the fields of high-power and high-frequency …