The instrument transfer function for optical measurements of surface topography

PJ de Groot - Journal of Physics: Photonics, 2021 - iopscience.iop.org
For optical measurements of areal surface topography, the instrument transfer function (ITF)
quantifies height response as a function of the lateral spatial frequency content of the …

A review of selected topics in interferometric optical metrology

PJ De Groot - Reports on Progress in Physics, 2019 - iopscience.iop.org
This review gathers together 15 special topics in modern interferometric metrology
representing a sampling of historical, current and future developments. The selected topics …

[HTML][HTML] Physics-based virtual coherence scanning interferometer for surface measurement

R Su, R Leach - Light: Advanced Manufacturing, 2021 - light-am.com
Virtual instruments provide task-specific uncertainty evaluation in surface and dimensional
metrology. We demonstrate the first virtual coherence scanning interferometer that can …

Scattering and three-dimensional imaging in surface topography measuring interference microscopy

R Su, J Coupland, C Sheppard, R Leach - JOSA A, 2021 - opg.optica.org
Surface topography measuring interference microscopy is a three-dimensional (3D) imaging
technique that provides quantitative analysis of industrial and biomedical specimens. Many …

[HTML][HTML] Contributions of holography to the advancement of interferometric measurements of surface topography

PJ de Groot, LL Deck, R Su, W Osten - Light: Advanced Manufacturing, 2022 - light-am.com
Two major fields of study in optics—holography and interferometry—have developed at
times independently and at other times together. The two methods share the principle of …

[HTML][HTML] Lens aberration compensation in interference microscopy

R Su, M Thomas, M Liu, J Drs, Y Bellouard… - Optics and Lasers in …, 2020 - Elsevier
Emergence of products that feature functional surfaces with complex geometries, such as
freeform optics in consumer electronics and augmented reality and virtual reality, requires …

3D modeling of coherence scanning interferometry on 2D surfaces using FEM

T Pahl, S Hagemeier, M Künne, D Yang… - Optics Express, 2020 - opg.optica.org
Despite the fact that optical profilers, such as coherence scanning interferometers, are
frequently used for fast and contactless topography measurements in various fields of …

Modeling of interference microscopy beyond the linear regime

M Thomas, R Su, N Nikolaev, J Coupland… - Optical …, 2020 - spiedigitallibrary.org
Coherence scanning interferometry (CSI), a type of interference microscopy, has found
broad applications in the advanced manufacturing industry, providing high-accuracy surface …

Analysis of interference microscopy in the spatial frequency domain

P Lehmann, M Künne, T Pahl - Journal of Physics: Photonics, 2021 - iopscience.iop.org
If high numerical apertures are used in coherence scanning interferometry, an extension of
the interference signal's spectral distribution to lower frequencies can be observed …

Information-rich surface metrology

N Senin, R Leach - Procedia Cirp, 2018 - Elsevier
Abstract Information-rich metrology refers to the incorporation of any type of available
information in the data acquisition and processing pipeline of a measurement process, in …