X‐ray microscopy can provide unique chemical, electronic, and structural insights into
perovskite materials and devices leveraging bright, tunable synchrotron X‐ray sources. Over …

Synchrotron-based photoemission electron microscopy (XPEEM) is one of the most powerful
spectro-microscopic techniques for the investigation of surfaces, interfaces, thin films and …

We demonstrate the use of a novel design of a photoelectron microscope in combination to
an imaging energy filter for momentum resolved photoelectron detection. Together with a …

Near-edge X-ray absorption fine structure (NEXAFS) spectroscopy is a powerful technique
for characterizing the composition and bonding state of nanoscale materials and the top few …

For a very long period, tin was considered one of the most important metals for humans due
to its easy access in nature and abundance of sources. In the past, tin was mainly used to …

The design and applications of an instrument for imaging X-ray photoelectron spectroscopy
(XPS) are reviewed. The instrument is based on a photoelectron microscope and a double …

Addition of an electron energy filter to low energy electron microscopy (LEEM) and
photoelectron emission microscopy (PEEM) instruments greatly improves their analytical …

Wide-bandgap semiconductors are exploited in several technological fields such as electron
emission devices, energy conversion, high-power high-temperature electronics, and …

The presence of gold on the sidewall of a tapered, single silicon nanowire is directly
quantified from core-level nanospectra using energy-filtered photoelectron emission …

Imaging XPS has been available on commercial XPS instruments since the 1990's, however
its exploitation in the elucidation of surface chemistry has been minimal due to historical …