High-K materials and metal gates for CMOS applications
J Robertson, RM Wallace - Materials Science and Engineering: R: Reports, 2015 - Elsevier
The scaling of complementary metal oxide semiconductor (CMOS) transistors has led to the
silicon dioxide layer used as a gate dielectric becoming so thin that the gate leakage current …
silicon dioxide layer used as a gate dielectric becoming so thin that the gate leakage current …
Atomic layer deposition: an overview
SM George - Chemical reviews, 2010 - ACS Publications
Atomic Layer Deposition: An Overview | Chemical Reviews ACS ACS Publications C&EN CAS
Find my institution Log In Chemical Reviews ACS Publications. Most Trusted. Most Cited. Most …
Find my institution Log In Chemical Reviews ACS Publications. Most Trusted. Most Cited. Most …
Crystallinity of inorganic films grown by atomic layer deposition: Overview and general trends
V Miikkulainen, M Leskelä, M Ritala… - Journal of Applied …, 2013 - pubs.aip.org
Atomic layer deposition (ALD) is gaining attention as a thin film deposition method, uniquely
suitable for depositing uniform and conformal films on complex three-dimensional …
suitable for depositing uniform and conformal films on complex three-dimensional …
Surface chemistry of atomic layer deposition: A case study for the trimethylaluminum/water process
RL Puurunen - Journal of applied physics, 2005 - pubs.aip.org
Atomic layer deposition (ALD), a chemical vapor deposition technique based on sequential
self-terminating gas–solid reactions, has for about four decades been applied for …
self-terminating gas–solid reactions, has for about four decades been applied for …
High dielectric constant oxides
J Robertson - The European Physical Journal-Applied Physics, 2004 - cambridge.org
The scaling of complementary metal oxide semiconductor (CMOS) transistors has led to the
silicon dioxide layer used as a gate dielectric becoming so thin (1.4 nm) that its leakage …
silicon dioxide layer used as a gate dielectric becoming so thin (1.4 nm) that its leakage …
High dielectric constant gate oxides for metal oxide Si transistors
J Robertson - Reports on progress in Physics, 2005 - iopscience.iop.org
The scaling of complementary metal oxide semiconductor transistors has led to the silicon
dioxide layer, used as a gate dielectric, being so thin (1.4 nm) that its leakage current is too …
dioxide layer, used as a gate dielectric, being so thin (1.4 nm) that its leakage current is too …
Island growth as a growth mode in atomic layer deposition: A phenomenological model
RL Puurunen, W Vandervorst - Journal of Applied Physics, 2004 - pubs.aip.org
Atomic layer deposition (ALD) has within the past few years received world-wide attention
for manufacturing conformal material layers with thickness in the nanometer range …
for manufacturing conformal material layers with thickness in the nanometer range …
HfO2 and Al2O3 gate dielectrics on GaAs grown by atomic layer deposition
MM Frank, GD Wilk, D Starodub, T Gustafsson… - Applied Physics …, 2005 - pubs.aip.org
High-performance metal-oxide-semiconductor field effect transistors (MOSFETs) on III–V
semiconductors have long proven elusive. High-permittivity (high-κ) gate dielectrics may …
semiconductors have long proven elusive. High-permittivity (high-κ) gate dielectrics may …
Thermal Atomic Layer Etching of SiO2 by a “Conversion-Etch” Mechanism Using Sequential Reactions of Trimethylaluminum and Hydrogen Fluoride
JW DuMont, AE Marquardt, AM Cano… - ACS applied materials …, 2017 - ACS Publications
The thermal atomic layer etching (ALE) of SiO2 was performed using sequential reactions of
trimethylaluminum (TMA) and hydrogen fluoride (HF) at 300° C. Ex situ X-ray reflectivity …
trimethylaluminum (TMA) and hydrogen fluoride (HF) at 300° C. Ex situ X-ray reflectivity …
Advanced high-κ dielectric stacks with polySi and metal gates: Recent progress and current challenges
EP Gusev, V Narayanan… - IBM Journal of Research …, 2006 - ieeexplore.ieee.org
The paper reviews our recent progress and current challenges in implementing advanced
gate stacks composed of high-κ dielectric materials and metal gates in mainstream Si CMOS …
gate stacks composed of high-κ dielectric materials and metal gates in mainstream Si CMOS …