Digital and analog TFET circuits: Design and benchmark

S Strangio, F Settino, P Palestri, M Lanuzza, F Crupi… - Solid-State …, 2018 - Elsevier
In this work, we investigate by means of simulations the performance of basic digital, analog,
and mixed-signal circuits employing tunnel-FETs (TFETs). The analysis reviews and …

Strained silicon complementary TFET SRAM: Experimental demonstration and simulations

GV Luong, S Strangio, AT Tiedemann… - IEEE journal of the …, 2018 - ieeexplore.ieee.org
A half SRAM cell with strained Si nanowire complementary tunnel-FETs (TFETs) was
fabricated and characterized to explore the feasibility and functionality of 6T-SRAM based …

Detection of breast cancer Cell-MDA-MB-231 by measuring conductivity of Schottky source/drain GaN FinFET

HD Sehgal, Y Pratap, S Kabra - IEEE Sensors Journal, 2022 - ieeexplore.ieee.org
In this paper, a new Gallium Nitride (GaN) Fin Field Effect Transistor (FinFET) with Schottky
Source/Drain is proposed for detection of breast cancer cells by studying the change in …

A 16 nm finfet circuit with triple function as digital multiplexer, active-high and active-low output decoder for high-performance sram architecture

B Jeevan, K Sivani - Semiconductor Science and Technology, 2022 - iopscience.iop.org
This paper presents a fin field-effect transistor (FinFET)-based single circuit (FSC) used to
realize an active-high output decoder (AHD), active-low output decoder (ALD) and digital …

Designing and Reliability analysis of radiation hardened Stacked gate Junctionless FinFET and CMOS Inverter

HD Sehgal, Y Pratap, S Kabra - IEEE Transactions on Device …, 2023 - ieeexplore.ieee.org
Along with radiation sensing, necessity to study and design reliable radiation hardened
devices is also increasing now-a-days. These devices are tolerant to high dosage of …

Operational transconductance amplifier designed with nanowire tunnel-FET with Si, SiGe and Ge sources using experimental data

A de Moraes Nogueira, PG Der Agopian… - Semiconductor …, 2020 - iopscience.iop.org
In this paper operational transconductance amplifiers (OTA) were designed with nanowire
(NW) tunnel field effect transistors (TFET) with different source materials (Si, SiGe, and Ge) …

Performance evaluation of Tunnel-FET basic amplifier circuits

RS Rangel, PGD Agopian… - 2019 IEEE 10th Latin …, 2019 - ieeexplore.ieee.org
This work analyzes the performance of measured Tunneling Field-Effect Transistors (TFET)
when applied to analog circuits. The method uses a look-up table based behavioral model …

An efficient single-stage carry select adder using excess-1 FinFET circuit in 22 nm technology

J Battini, S Kosaraju - Semiconductor Science and Technology, 2024 - iopscience.iop.org
Conventional carry select adders (CCSA) have two stages and are followed by multiplexers.
CCSAs use ripple carry adders at two stages, which will introduce much delay due to carry …

A tunnel-FET device model based on Verilog-A applied to circuit simulation

RS Rangel, PGD Agopian… - 2018 33rd Symposium on …, 2018 - ieeexplore.ieee.org
This work proposes a simple methodology for using Tunnel-FET devices, which do not have
any accurate first order analytic models, for allowing the integrated circuit simulation with …

Silicon nanowire Tunnel-FET differential amplifier using Verilog-A lookup table approach

AM Nogueira, PGD Agopian… - 2019 34th Symposium on …, 2019 - ieeexplore.ieee.org
Electrical characterization of a silicon nanowire Tunnel Field Effect Transistor (TFET) is used
to construct a lookup table in order to model and simulate analog circuit through Verilog-A …