Progress on carbon nanotube BEOL interconnects

B Uhlig, J Liang, J Lee, R Ramos… - … , Automation & Test …, 2018 - ieeexplore.ieee.org
This article is a review of the current progress and results obtained in the European H2020
CONNECT project. Amongst all the research on carbon nanotube interconnects, those …

Quantitative temperature distribution measurements by non-contact scanning thermal microscopy using Wollaston probes under ambient conditions

Y Zhang, W Zhu, L Han, T Borca-Tasciuc - Review of Scientific …, 2020 - pubs.aip.org
Temperature measurement using Scanning Thermal Microscopy (SThM) usually involves
heat transfer across the mechanical contact and liquid meniscus between the thermometer …

Experimental evaluation of self-heating and analog/RF FOM in GAA-nanowire FETs

R Singh, K Aditya, A Veloso… - IEEE Transactions on …, 2019 - ieeexplore.ieee.org
In this paper, we report the characterization and modeling of multi-finger gate all around
(GAA) nanowire (NW) FETs (NWFETs) from dc to 14 GHz. The self-heating effect (SHE) in …

Thermal SPICE modeling of FinFET and BEOL considering frequency-dependent transient response, 3-D heat flow, boundary/alloy scattering, and interfacial thermal …

CC Chung, HH Lin, WK Wan… - IEEE Transactions on …, 2019 - ieeexplore.ieee.org
High device density and high power density intensify the self-heating effect in scaled FinFET
circuits to degrade both device and back-end-of-line (BEOL) reliability. The boundary …

Elucidating the electrical performance and thermal stability in14-nm FinFETs CMOS technology

F Nasri, S Glayed, N Jaba, A Mera, M Atri… - Micro and …, 2022 - Elsevier
Nanoscale device self-heating effects have become an important issue in simulation and
fabrication of Bulk and SOI FinFET transistors. In this work, we have investigated a …

[PDF][PDF] Analogue and RF performances of Fully Depleted SOI MOSFET

JP Raskin - 2019 ISTE OpenScience-Published by ISTE Ltd …, 2019 - openscience.fr
Performance of RF integrated circuit (IC) is directly linked to the analogue and high
frequency characteristics of the transistors, the quality of the back-end of line process as well …

Self-Heating of FinFET Circuitry Simulated by Multi-Correlated Recurrent Neural Networks

CC Chung, BW Huang, HC Lin, T Chou… - IEEE Electron …, 2022 - ieeexplore.ieee.org
A series of multi-correlated recurrent neural networks is used to predict the relative
temperature of inverter chains folded in 3 rows. The circuit hotspot temperature is predicted …

Suppression Strategy of Snapback Effect for Multi-Cell RC-IGBT

Z Chang, X Yang, X Hou, H Tang - 2020 IEEE 9th International …, 2020 - ieeexplore.ieee.org
The snapback effect of RC-IGBT occurs when the device transits from the unipolar mode to
the bipolar mode during the turn-on process, which will increase the switching loss and …

Scanning tunneling thermometer

ASC Shastry, CA Stafford - US Patent 11,215,636, 2022 - Google Patents
Various examples are provided related to scanning tunneling thermometers and scanning
tunneling microscopy (STM) techniques. In one example, a method includes simultane ously …

[HTML][HTML] The investigation of self-heating effect on Si1-xGex FinFETs with different device structures, Ge concentration, and operated voltages

MH Liao, CP Hsieh, CC Lee - AIP Advances, 2017 - pubs.aip.org
The self-heating effect on Si 1-x Ge x based FinFETs is analyzed and investigated with
different device structures/dimensions, Ge concentration, and operated voltages. The …