Thin germanium-carbon alloy layers grown directly on silicon for metal-oxide-semiconductor device applications

DQ Kelly, I Wiedmann, JP Donnelly, SV Joshi… - Applied physics …, 2006 - pubs.aip.org
We report the growth and characterization of thin (< 35 nm) germanium-carbon alloy (Ge 1−
x C x) layers grown directly on Si by ultrahigh-vacuum chemical vapor deposition, with …

Hall mobilities in B-doped strained and layers grown by ultrahigh vacuum chemical vapor deposition

GS Kar, A Dhar, SK Ray, S John… - Journal of Applied …, 2000 - pubs.aip.org
Hall mobilities in a temperature range of 80–300 K have been measured in fully strained Si
1− x Ge x and partially strain-compensated p-type Si 1− x− y Ge x C y alloy layers grown on …

Conventional pyrolysis of [CCSiMe2CCGeMe2] n polymer precursor for Si/Ge/C materials

V Dřínek, A Galíková, J Šubrt, R Fajgar - Journal of Analytical and Applied …, 2008 - Elsevier
Synthesis and subsequent conventional pyrolysis of polymer precursor
[CCSiMe2CCGeMe2] n (n∼ 12) is reported. Fourier transformed IR and thermogravimetry …

[图书][B] Incorporation of the silicon germanium carbon compound in the realization of a bipolar inversion channel field-effect transistor (BICFET)

DL Sharer - 1999 - search.proquest.com
The feasibility of fabrication of an inversion base transistor in the BICFET (Bipolar Inversion
Channel Field Effect Transistor) configuration is investigated in this project. The requisite …

The effects of composition and doping on the response of GeC-Si photodiodes

J Kolodzey, O Gauthier-Lafaye… - IEEE Journal of …, 1998 - ieeexplore.ieee.org
The spectral responses of a series of heterojunction diodes of p-type Ge/sub 1-y/C/sub y/on
n-type Si (100) substrates were measured by Fourier transform infrared (IR) spectroscopy …

[PDF][PDF] SiGeC Optoelectronic Devices

J Kolodzey - 2001., 2001 - Citeseer
Hall effect measurements showed that the addition of carbon could increase the hole
mobility in GeC as compared to that in pure Ge. One possible reason is that the addition of …

Hall coefficient singularity observed from p-SiGeC grown on n'-Si substrate

M Ahoujja, YK Yeo, MR Smith… - Compound …, 2000 - api.taylorfrancis.com
New possibilities are presented for high sensitive technology control of epitaxial
semiconductor heterosystems. Transformation of the crystal atomic planes (hkl) parallel to …