Reliability concerns due to technology scaling have been a major focus of researchers and
designers for several technology nodes. Therefore, many new techniques for enhancing and …

In a digital circuit, the addition of certain number of bits is generic operation used in order to
pare the complexity of the circuit and it operation. The selection of proper adder with …

Ferroelectric FETs (FEFETs) are emerging devices with potential for low power applications.
The unique feature which makes these devices suitable for ultra-low voltage operation is the …

NBTI is one of the most important silicon reliability problems facing processor designers
today. The impact of NBTI can be mitigated at both the circuit and microarchitecture levels. In …

Currently, the demand for reliable and high performance computing is increasing due to the
enlarging susceptibility of computing circuits to different environmental effects, and the …

Evolving processing units in complex computing systems are dealing with smaller gates and
devices which are seriously influenced by external effects such as electromagnetic noises …

Dennard scaling has ended. Lowering the voltage supply (V dd) to sub-volt levels causes
intermittent losses in signal integrity, rendering further scaling (down) no longer acceptable …

This paper presents a low cost fault-tolerant technique so called OWHR (Operand Width
Aware Hardware Reuse) to ALU design in embedded processors. The OWHR technique is …

Dennard scaling ended a decade ago. Energy reduction by lowering supply voltage has
been limited because of guard bands and a subthreshold slope of over 60mV/decade in …

Digital circuits are expected to increasingly suffer from more hard faults due to technology
scaling. Especially, a single hard fault in the ALU might lead to a total failure in the …