Electron Microscopy of Solid Catalysts Transforming from a Challenge to a Toolbox

DS Su, B Zhang, R Schlögl - Chemical reviews, 2015 - ACS Publications
Nanoscience is a cross-sectional interdisciplinary field of research that can hardly be
overestimated in its enabling character for technologies in many application areas. A …

Structure and bonding at the atomic scale by scanning transmission electron microscopy

DA Muller - Nature materials, 2009 - nature.com
A new generation of electron microscopes is able to explore the microscopic properties of
materials and devices as diverse as transistors, turbine blades and interfacial …

Electron microscopy of polymers

GH Michler, W Lebek - Polymer Morphology: Principles …, 2016 - Wiley Online Library
The structures and morphologies of polymers have been under investigation by means of
electron microscopy for more than 60 years. Electron microscopy (EM) can be divided into …

An electron microscope for the aberration-corrected era

OL Krivanek, GJ Corbin, N Dellby, BF Elston, RJ Keyse… - Ultramicroscopy, 2008 - Elsevier
Improved resolution made possible by aberration correction has greatly increased the
demands on the performance of all parts of high-end electron microscopes. In order to meet …

Observation of rare-earth segregation in silicon nitride ceramics at subnanometre dimensions

N Shibata, SJ Pennycook, TR Gosnell, GS Painter… - Nature, 2004 - nature.com
Abstract Silicon nitride (Si3N4) ceramics are used in numerous applications because of their
superior mechanical properties,. Their intrinsically brittle nature is a critical issue, but can be …

Depth sectioning with the aberration-corrected scanning transmission electron microscope

AY Borisevich, AR Lupini… - Proceedings of the …, 2006 - National Acad Sciences
The ability to correct the aberrations of the probe-forming lens in the scanning transmission
electron microscope provides not only a significant improvement in transverse resolution but …

Materials characterization in the aberration-corrected scanning transmission electron microscope

M Varela, AR Lupini, K Benthem… - Annu. Rev. Mater …, 2005 - annualreviews.org
▪ Abstract In the nanoscience era, the properties of many exciting new materials and devices
will depend on the details of their composition down to the level of single atoms. Thus the …

Synthesis, surface studies, composition and structural characterization of CdSe, core/shell and biologically active nanocrystals

SJ Rosenthal, J McBride, SJ Pennycook… - Surface science …, 2007 - Elsevier
Nanostructures, with their very large surface to volume ratio and their non-planar geometry,
present an important challenge to surface scientists. New issues arise as to surface …

[图书][B] Aberration-corrected imaging in transmission electron microscopy: An introduction

R Erni - 2015 - books.google.com
Aberration-Corrected Imaging in Transmission Electron Microscopy provides an introduction
to aberration-corrected atomic-resolution electron microscopy imaging in materials and …

STEM imaging of 47-pm-separated atomic columns by a spherical aberration-corrected electron microscope with a 300-kV cold field emission gun

H Sawada, Y Tanishiro, N Ohashi… - Journal of Electron …, 2009 - academic.oup.com
A spherical aberration-corrected electron microscope has been developed recently, which is
equipped with a 300-kV cold field emission gun and an objective lens of a small chromatic …