[HTML][HTML] Conduction channel configuration controlled digital and analog response in TiO2-based inorganic memristive artificial synapses

FM Simanjuntak, CL Hsu, T Abbey, LY Chang… - APL Materials, 2021 - pubs.aip.org
The operating current regime is found to play a key role in determining the synaptic
characteristic of memristor devices. A conduction channel that is formed using high current …

Demonstration of Ultra‐Fast Switching in Nanometallic Resistive Switching Memory Devices

X Yang - Journal of Nanoscience, 2016 - Wiley Online Library
Interdependency of switching voltage and time creates a dilemma/obstacle for most resistive
switching memories, which indicates low switching voltage and ultra‐fast switching time …

[HTML][HTML] Tunable resistive switching in shales

X Miao, W Lu, Y Yu, X Liu, H Zhan, K Zhao - Results in Physics, 2023 - Elsevier
Electrically induced resistive switching is a subject of increasing scientific interest because it
is a candidate for universal non-volatile memory. We demonstrate resistive switching in a …

[HTML][HTML] Probing material conductivity in two-terminal devices by resistance difference

Y Lu, IW Chen - Applied Physics Letters, 2017 - pubs.aip.org
It is generally impossible in two-terminal devices to separate the resistance of the device
material from the parasitic resistance of terminals, interfaces, and serial loads, yet such …

快速退火温度对Ag/SrTiO3/p+-Si 器件阻变特性的影响.

张文博, 王华, 许积文, 卢晓鹏… - … Components & Materials, 2017 - search.ebscohost.com
采用溶胶-凝胶结合快速退火工艺在p+-Si 基片上制备了SrTiO3 薄膜, 构建了Ag/SrTiO3/p+-Si
结构的阻变器件, 研究了退火温度对薄膜微观结构, 阻变特性的影响. 结果表明 …

[图书][B] Quantum Electronic Interference in Nano Amorphous Silicon and Other Thin Film Resistance Memory

Y Lu - 2017 - search.proquest.com
This thesis describes conductivity in amorphous semiconductors and insulators—some
doped with metals, in which elastic electrons can random walk across a transport length of …

Focus ion beam-induced mechanical stress switching in an ultra-fast resistive switching device

X Yang - Applied Physics A, 2016 - Springer
Abstract The Mo/Si 3 N 4: Pt/Pt nanometallic resistive switching devices with ultra-fast
write/erase speed (< 50 ns) were fabricated. Other than conventional electrical switching, a …

Tunable Resistive Switching in Shales

M Xinyang, W Lu, Y Yu, X Liu, H Zhan… - Available at SSRN … - papers.ssrn.com
Electrically induced resistive switching is a subject of increasing scientific interest because it
is a candidate for universal non-volatile memory. We demonstrate resistive switching in a …

Effect of Annealing Temperature on the Resistive Characteristics of Ag/Hfo 2/P+-Si Storage Units

Y Liu, K Luan, Y He - papers.ssrn.com
HfO2 thin films were prepared on p+-Si substrates by magnetron sputtering combined with
annealing process, and the Ag/HfO2/p+-Si structured resistive storage cells were …

Probing Intrinsic Material Conductivity in Two-Terminal Devices: A Resistance-Difference Method

Y Lu, IW Chen - arXiv preprint arXiv:1610.07666, 2016 - arxiv.org
It is generally impossible to separately measure the resistance of the functional component
(ie, the intrinsic device materials) and the parasitic component (ie, terminals, interfaces and …