Boosting Latent Defect Coverage in Automotive Mixed-Signal ICs Using SVM Classifiers
In industry-scale integrated circuit (IC) production, continuous improvements in processing
and testing have resulted in defect test escape rates gradually reaching levels below 100 …
and testing have resulted in defect test escape rates gradually reaching levels below 100 …
On Latent Defect Acceleration
Y Jin, Y Zhang, H Zhang, C Chen, X Lin… - … of Electronics Design …, 2024 - ieeexplore.ieee.org
With the widespread application of chips in mission-critical and safety-critical fields, ensuring
that chips do not fail during operation has become crucial. However, the increasing number …
that chips do not fail during operation has become crucial. However, the increasing number …