Normally-OFF AlGaN/GaN MIS-HEMTs With Low RON and Vth Hysteresis by Functioning In-situ SiNx in Regrowth Process
Normally-off AlGaN/GaN MIS-HEMTs with a high threshold voltage () more than 2.5 V and a
low on-resistance of mm have been achieved by an improved regrowth technique with in …
low on-resistance of mm have been achieved by an improved regrowth technique with in …
Heterogeneous integration of high-k complex-oxide gate dielectrics on wide band-gap high-electron-mobility transistors
Heterogeneous integration of dissimilar crystalline materials has recently attracted
considerable attention due to its potential for high-performance multifunctional electronic …
considerable attention due to its potential for high-performance multifunctional electronic …
Interface charge engineering on an in situ SiNx/AlGaN/GaN platform for normally off GaN MIS-HEMTs with improved breakdown performance
This work adopts interface charge engineering to fabricate normally off metal–insulator–
semiconductor high electron mobility transistors (MIS-HEMTs) on an in situ SiN …
semiconductor high electron mobility transistors (MIS-HEMTs) on an in situ SiN …
Significant effect of thin oxide layer on characteristics of p-InGaN/GaN nonalloyed ohmic contacts
F Zhang, R Wang, F Li, A Tian, J Liu… - Journal of Applied …, 2023 - pubs.aip.org
In an interconnected high-vacuum illustration system, the surfaces of p-InGaN/GaN
heterostructures grown with integrated metalorganic chemical vapor deposition were treated …
heterostructures grown with integrated metalorganic chemical vapor deposition were treated …
Low trap density of oxygen-rich HfO2/GaN interface for GaN MIS-HEMT applications
The high-k nature of HfO 2 makes it a competitive gate oxide for various GaN-based power
devices, but the high trap densities at the HfO 2/GaN interface have hindered the …
devices, but the high trap densities at the HfO 2/GaN interface have hindered the …
Performance enhancement of ultraviolet light-emitting diodes by manipulating Al composition of InGaN/AlGaN superlattice strain release layer
Y Qian, P Du, P Liu, S Zhou - Journal of Applied Physics, 2022 - pubs.aip.org
InGaN/AlGaN ultraviolet light-emitting diodes (UV LEDs) suffer from residual in-plane
compressive stress and poor carrier injection efficiency. Here, we simultaneously reduce the …
compressive stress and poor carrier injection efficiency. Here, we simultaneously reduce the …
Improved performance of GaN metal-insulator-semiconductor high-electron-mobility transistors towards power applications
J He - 2024 - theses.lib.polyu.edu.hk
GaN metal-insulator-semiconductor high electron mobility transistors (MIS-HEMTs) are
potential candidates for the next generation of high-power electronics. To further reduce …
potential candidates for the next generation of high-power electronics. To further reduce …
Surface State Effect on P-Ingan/Gan Nonalloyed Ohmic Contact Characteristics
F Zhang, R Wang, F Li, A Tian, J Liu… - Gan Nonalloyed Ohmic … - papers.ssrn.com
After the surfaces of p-InGaN/GaN samples were subsequently exposed to O2 for different
times at room temperature, Pd/Pt/Au were sputtered on them to investigate their current …
times at room temperature, Pd/Pt/Au were sputtered on them to investigate their current …
[图书][B] Technological Developments in Pursuit of Recess-Free Normally-Off Algan/Gan HEMTs
WC Cheng - 2021 - search.proquest.com
Thanks to GaN's high breakdown electric field, high electron mobility and saturation velocity,
GaN-based devices are considered promising candidates for power switching and RF …
GaN-based devices are considered promising candidates for power switching and RF …