Highly efficient GaN-based high-power flip-chip light-emitting diodes

S Zhou, X Liu, H Yan, Z Chen, Y Liu, S Liu - Optics express, 2019 - opg.optica.org
High-power flip-chip light-emitting diodes (FCLEDs) suffer from low efficiencies because of
poor p-type reflective ohmic contact and severe current crowding. Here, we show that it is …

Study on the current spreading effect and light extraction enhancement of vertical GaN/InGaN LEDs

CK Li, YR Wu - IEEE transactions on electron devices, 2011 - ieeexplore.ieee.org
This study analyzes the current spreading effect and light extraction efficiency (LEE) of
lateral and vertical light-emitting diodes (LEDs). Specifically, this study uses a fully 2-D …

Effect of current spreading on the efficiency droop of InGaN light-emitting diodes

HY Ryu, JI Shim - Optics Express, 2011 - opg.optica.org
We investigate the effects of current spreading on the efficiency droop of InGaN blue light-
emitting diodes with lateral injection geometry based on numerical simulation. Current …

[HTML][HTML] Reduction of on-resistance and current crowding in quasi-vertical GaN power diodes

Y Zhang, M Sun, D Piedra, J Hennig, A Dadgar… - Applied Physics …, 2017 - pubs.aip.org
This paper studies the key parameters affecting on-resistance and current crowding in quasi-
vertical GaN power devices by experiment and simulation. The current distribution in the drift …

The composited high reflectivity p-type electrodes with patterned ITO for AlGaN-based ultraviolet light emitting diodes

J Lang, FJ Xu, JM Wang, LS Zhang, ZH Sun… - Applied Physics …, 2024 - pubs.aip.org
Composited p-type electrodes with high reflectivity have been investigated in AlGaN-based
ultraviolet light emitting diodes (UV-LEDs) to improve the light extraction efficiency, which …

Steady-state junction current distribution in pn GaN diodes measured using low-energy electron microscopy (LEEM)

WY Ho, CW Johnson, T Tak, M Sauty, YC Chow… - Applied Physics …, 2023 - pubs.aip.org
We report on the measurement of the lateral distribution of the junction current of an
electrical biased pn GaN diode by electron emission microscopy using a low-energy …

Enhanced wall-plug efficiency in AlGaN-based deep-ultraviolet LED via a novel honeycomb hole-shaped structure

S Zhang, F Wu, S Wang, H Zhang… - IEEE transactions on …, 2019 - ieeexplore.ieee.org
The novel honeycomb hole-shaped electrode (HHSE) structure was proposed for 280-nm
AlGaN-based flip-chip deep-ultraviolet light emitting diode (DUV-LED), which was …

Enhanced optical performance of AlGaN-based deep ultraviolet light-emitting diodes by electrode patterns design

Q Chen, J Dai, X Li, Y Gao, H Long… - IEEE Electron …, 2019 - ieeexplore.ieee.org
Low external quantum efficiency of deep ultraviolet light-emitting diodes (DUV LEDs) and
current crowding can result in considerable heat generation, which has a great negative …

A chip-level electrothermal-coupled design model for high-power light-emitting diodes

S Huang, H Wu, B Fan, B Zhang, G Wang - Journal of Applied Physics, 2010 - pubs.aip.org
An advanced three-dimensional electrothermal-coupled simulation model basing on finite-
element method numerical simulation is developed to study the electrical and thermal …

Effect of the Electrode Pattern on Current Spreading and Driving Voltage in a GaN∕ Sapphire LED Chip

GJ Sheu, FS Hwu, JC Chen, JK Sheu… - Journal of the …, 2008 - iopscience.iop.org
The effects of p-and n-electrode patterning on the current spreading and driving voltage of a
side-view GaN∕ sapphire light-emitting diode (LED) chip are investigated via a numerical …