With the semiconductor manufacturing technology approaching to 14 nm and below, the
reliability of IC is challenged, as the speed of CMOS or FinFET is degraded by the aging …

Device aging is an important concern in nanoscale designs. Due to aging the electrical
behavior of transistors embedded in an integrated circuit deviates from original intended …

CMOS miniaturization and timing faults due to factors, such as aging, emphasize that
embedded processor reliability is a major concern. Among the various aging mechanisms …

As technology further scales semiconductor devices, aging-induced device degradation has
become one of the major threats to device reliability. In addition, aging mechanisms like the …

Negative bias temperature instability (NBTI) is a phenomenon commonly observed in p-
channel metal-oxide semiconductor (MOS) devices simultaneously exposed to elevated …

Circuit aging causes a performance degradation and eventually a functional failure. It
depends on the workload and the environmental condition of the system, which are hard to …

CMOS technology scaling makes aging effects an important concern for the design and
fabrication of integrated circuits. Aging deterioration reduces the useful life of a circuit …

Lifetime reliability management of miniaturized CMOS devices continuously gets more
importance with the shrinking of technology size. Neither of existing design-time solutions …

Concerns exist that the reliability of chips is worsening because of downscaling technology.
Among various reliability challenges, device aging is a dominant concern because it …

Counterfeit electronics parts have changed today's electronic market all over the world. A
large number of Integrated Circuit (IC) designers, manufacturers and suppliers present in the …