High-speed black phosphorus field-effect transistors approaching ballistic limit
As a strong candidate for future electronics, atomically thin black phosphorus (BP) has
attracted great attention in recent years because of its tunable bandgap and high carrier …
attracted great attention in recent years because of its tunable bandgap and high carrier …
Analysis of self-heating effects in ultrathin-body SOI MOSFETs by device simulation
C Fiegna, Y Yang, E Sangiorgi… - IEEE Transactions on …, 2007 - ieeexplore.ieee.org
This paper discusses self-heating (SHE) effects in silicon-on-insulator (SOI) CMOS
technology and applies device simulation to analyze the impact of thermal effects on the …
technology and applies device simulation to analyze the impact of thermal effects on the …
Understanding quasi-ballistic transport in nano-MOSFETs: part I-scattering in the channel and in the drain
P Palestri, D Esseni, S Eminente… - … on Electron Devices, 2005 - ieeexplore.ieee.org
In this paper, and in Part II, Monte Carlo (MC) simulations including quantum corrections to
the potential and calibrated scattering models are used to study electronic transport in bulk …
the potential and calibrated scattering models are used to study electronic transport in bulk …
Theoretical study of some physical aspects of electronic transport in nMOSFETs at the 10-nm gate-length
We discuss selected aspects of the physics of electronic transport in nMOSFETs at the 10-
nm scale: Long-range Coulomb interactions, which may degrade performance and even …
nm scale: Long-range Coulomb interactions, which may degrade performance and even …
Investigation of the transport properties of silicon nanowires using deterministic and Monte Carlo approaches to the solution of the Boltzmann transport equation
M Lenzi, P Palestri, E Gnani, S Reggiani… - … on Electron Devices, 2008 - ieeexplore.ieee.org
We investigate the transport properties of silicon-nanowire FETs by using two different
approaches to the solution of the Boltzmann equation for the quasi-1-D electron gas …
approaches to the solution of the Boltzmann equation for the quasi-1-D electron gas …
Scaling MOSFETs to 10 nm: Coulomb effects, source starvation, and virtual source model
In our attempts to scale FETs to the 10 nm length, alternatives to conventional Si CMOS are
sought on the grounds that:(1) Si seems to have reached its technological and performance …
sought on the grounds that:(1) Si seems to have reached its technological and performance …
Multisubband Monte Carlo study of transport, quantization, and electron-gas degeneration in ultrathin SOI n-MOSFETs
L Lucci, P Palestri, D Esseni… - IEEE transactions on …, 2007 - ieeexplore.ieee.org
This paper presents a new self-consistent multisubband Monte Carlo model for electronic
transport in the inversion layer of decananometric MOSFETs. The simulator is 2-D in real …
transport in the inversion layer of decananometric MOSFETs. The simulator is 2-D in real …
On backscattering and mobility in nanoscale silicon MOSFETs
C Jeong, DA Antoniadis… - IEEE Transactions on …, 2009 - ieeexplore.ieee.org
The DC current-voltage characteristics of an n-channel silicon MOSFET with an effective
gate length of about 60 nm are analyzed and interpreted in terms of scattering theory. The …
gate length of about 60 nm are analyzed and interpreted in terms of scattering theory. The …
Highly manufacturable double-gate FinFET with gate-source/drain underlap
JW Yang, PM Zeitzoff, HH Tseng - IEEE Transactions on …, 2007 - ieeexplore.ieee.org
The speed performance of a double-gate (DG) FinFET CMOS with gate-source/drain (GS/D)
underlap is investigated using 2-D device and mixed-mode circuit simulation. By optimizing …
underlap is investigated using 2-D device and mixed-mode circuit simulation. By optimizing …
Simulation of self-heating effects in different SOI MOS architectures
M Braccioli, G Curatola, Y Yang, E Sangiorgi… - Solid-state …, 2009 - Elsevier
This paper discusses self-heating effects in different silicon-on-insulator architectures by 3D
electro-thermal simulations. First of all, we compare different device architectures such as …
electro-thermal simulations. First of all, we compare different device architectures such as …