Embedded microprocessor cache memories suffer from limited observability and
controllability creating problems during in-system tests. This paper presents a procedure to …

Nowadays, on-line testing is essential for modern microprocessors to detect latent defects
that either escape manufacturing testing or appear during system operation. Small …

This paper explores the effectiveness of the simultaneous application of pipelining and
parallel processing as a total power (static plus dynamic) reduction technique in digital …

Software-based self-test (SBST) is increasingly used for testing processor cores embedded
in SoCs, mainly because it allows at-speed, low-cost testing, while requiring limited (if any) …

The usage of electronic systems in safety-critical applications requires mechanisms for the
early detection of faults affecting the hardware while the system is in the field. When the …

Nowadays, on-line testing is essential for modern high-density microprocessors to detect
either latent hardware defects or new defects appearing during lifetime both in logic and …

March tests are widely used in the process of RAM testing. This family of tests is very efficient
in the case of simple faults such as stuck-at or transition faults. In the case of a complex fault …

Small microcontroller-based systems are omnipresent. Often, they do not have Memory BIST
(MBIST), or the MBIST is not available to the user. In such cases the CPU will be the only …

Testing SoC is a challenging task, especially when addressing complex and high-frequency
devices. Among the different techniques that can be exploited, Software-Based Selft-Test …

SBST (Software Based Self-Testing) is an effective solution for in-system testing of SoCs
without any additional hardware requirement. SBST is particularly suited for embedded …