How to control defect formation in monolithic III/V hetero-epitaxy on (100) Si? A critical review on current approaches
B Kunert, Y Mols, M Baryshniskova… - Semiconductor …, 2018 - iopscience.iop.org
The monolithic hetero-integration of III/V materials on Si substrates could enable a multitude
of new device applications and functionalities which would benefit from both the excellent …
of new device applications and functionalities which would benefit from both the excellent …
Epitaxial growth of highly mismatched III-V materials on (001) silicon for electronics and optoelectronics
Monolithic integration of III-V on silicon has been a scientifically appealing concept for
decades. Notable progress has recently been made in this research area, fueled by …
decades. Notable progress has recently been made in this research area, fueled by …
[HTML][HTML] Epitaxial growth of antiphase boundary free GaAs layer on 300 mm Si (001) substrate by metalorganic chemical vapour deposition with high mobility
R Alcotte, M Martin, J Moeyaert, R Cipro, S David… - Apl Materials, 2016 - pubs.aip.org
Metal organic chemical vapor deposition of GaAs on standard nominal 300 mm Si (001)
wafers was studied. Antiphase boundary (APB) free epitaxial GaAs films as thin as 150 nm …
wafers was studied. Antiphase boundary (APB) free epitaxial GaAs films as thin as 150 nm …
[图书][B] Metalorganic vapor phase epitaxy (MOVPE): Growth, materials properties, and applications
S Irvine, P Capper - 2019 - books.google.com
Systematically discusses the growth method, material properties, and applications for key
semiconductor materials MOVPE is a chemical vapor deposition technique that produces …
semiconductor materials MOVPE is a chemical vapor deposition technique that produces …
Dangling bond defects on si surfaces and their consequences on energy band diagrams: From a photoelectrochemical perspective
DC Moritz, W Calvet, MA Zare Pour, A Paszuk… - Solar …, 2023 - Wiley Online Library
Using silicon in multijunction photocells leads to promising device structures for direct
photoelectrochemical water splitting. In this regard, photoelectron spectra of silicon surfaces …
photoelectrochemical water splitting. In this regard, photoelectron spectra of silicon surfaces …
Metalorganic vapor phase epitaxy of III–V-on-silicon: Experiment and theory
O Supplie, O Romanyuk, C Koppka, M Steidl… - Progress in Crystal …, 2018 - Elsevier
The integration of III–V semiconductors with Si has been pursued for more than 25 years
since it is strongly desired in various high-efficiency applications ranging from …
since it is strongly desired in various high-efficiency applications ranging from …
Inversion Boundary Annihilation in GaAs Monolithically Grown on On‐Axis Silicon (001)
Monolithic integration of III–V materials and devices on CMOS compatible on‐axis Si (001)
substrates enables a route of low‐cost and high‐density Si‐based photonic integrated …
substrates enables a route of low‐cost and high‐density Si‐based photonic integrated …
Toward the III–V/Si co-integration by controlling the biatomic steps on hydrogenated Si (001)
The integration of III-V on silicon is still a hot topic as it will open up a way to co-integrate Si
CMOS logic with photonic devices. To reach this aim, several hurdles should be solved, and …
CMOS logic with photonic devices. To reach this aim, several hurdles should be solved, and …
Time-resolved in situ spectroscopy during formation of the GaP/Si (100) heterointerface
Though III–V/Si (100) heterointerfaces are essential for future epitaxial high-performance
devices, their atomic structure is an open historical question. Benchmarking of transient …
devices, their atomic structure is an open historical question. Benchmarking of transient …
Electron channeling contrast imaging investigation of stacking fault pyramids in GaP on Si nucleation layers
Thin gallium phosphide layers were deposited on (0 0 1) Silicon surfaces via organometallic
vapor phase epitaxy and characterized by electron channeling contrast imaging (ECCI) …
vapor phase epitaxy and characterized by electron channeling contrast imaging (ECCI) …