[HTML][HTML] Development of lead-free interconnection materials in electronic industry during the past decades: Structure and properties

S Zhong, L Zhang, M Li, W Long, F Wang - Materials & Design, 2022 - Elsevier
During the past decades, series of lead-free solders have been developed rapidly, and are
considered as the attractive interconnection materials replacing traditional Sn-Pb solders in …

[HTML][HTML] Nucleation and growth of Ag3Sn in Sn-Ag and Sn-Ag-Cu solder alloys

Y Cui, JW Xian, A Zois, K Marquardt, H Yasuda… - Acta Materialia, 2023 - Elsevier
Abstract Large Ag 3 Sn plates in solder joints can affect the reliability of electronics,
however, the factors affecting their nucleation and morphology are not well understood …

Complexity and evolution of a three-phase eutectic during coarsening uncovered by 4D nano-imaging

GR Lindemann, P Chao, V Nikitin, V De Andrade… - Acta Materialia, 2024 - Elsevier
We investigate the coarsening dynamics of the three-phase eutectic Al-Ag 2 Al-Al 2 Cu at
723 K via in situ transmission X-ray nano-tomography. Unlike previous investigations that …

The role of microstructure in the thermal fatigue of solder joints

JW Xian, YL Xu, S Stoyanov, RJ Coyle… - Nature …, 2024 - nature.com
Thermal fatigue is a common failure mode in electronic solder joints, yet the role of
microstructure is incompletely understood. Here, we quantify the evolution of microstructure …

Fatigue cracking growth of SAC305 solder ball under rapid thermal shock

C Liu, D Xia, M Tian, S Chen, G Gan, Y Du, X Liu… - Engineering Fracture …, 2022 - Elsevier
This research investigated the effects of rapid thermal shock cycle on the internal cracks,
microstructure and internal cracks of SAC305 ball by applying non-destructive high energy …

Evaluation of solder joint reliability in 3D packaging memory devices under thermal shock

S Zhou, Z Lin, B Qiu, H Wang, J Xiong, C He, B Zhou… - Electronics, 2022 - mdpi.com
In 3D packaging memory devices, solder joints are critical links between the chip and the
printed circuit board (PCB). Under severe working conditions, cracks inevitably occur due to …

Thermal cycle reliability and creep behavior of nano-IMC mixed solder joints

H Gao, W Liu, R An, C Hang, Y Tian - Journal of Materials Science …, 2023 - Springer
Herein, the microstructure evolution, crack initiation and propagation, and β-Sn
recrystallization behavior of nano-intermetallic compound (nano-IMC)-mixed solder joints …

Domain structure of pseudosymmetric η ″-ordered Cu6Sn5 by EBSD analysis

S Martin, A Winkelmann, A Leineweber - Acta Materialia, 2022 - Elsevier
Cu 6 Sn 5 is the most prominent intermetallic developing eg in solder joints between a Cu-
based conductor material and a Sn-based solder. Mechanical reliability issues connected …

Effect of nano-intermetallic compound on creep properties and β-Sn grain recrystallization of Cu/Sn-Ag-Cu/Ni solder joints

H Gao, W Liu, R An, C Hang, Y Tian - Materials Today Communications, 2023 - Elsevier
In this paper, the nanoindentation method was used to study the creep properties of nano-
intermetallic compound (nano-IMC) mixed solder joints. Furthermore, the microstructure …

Pb-free solders and aerospace/defense (A&D) high performance considerations

A Rafanelli, D Hillman, C Johnson… - Journal of Surface …, 2023 - journal.smta.org
The Aerospace & Defense (A & D) industries maintain a high level of interest in the
expansive amount of work performed in developing and qualifying Pb-free solder alloys. The …