Spectroscopic imaging ellipsometry for automated search of flakes of mono-and n-layers of 2D-materials
Spectroscopic imaging ellipsometry (SIE) is used to localize and characterize flakes of
conducting, semi-conducting and insulating 2D-materials. Although the research in the field …
conducting, semi-conducting and insulating 2D-materials. Although the research in the field …
Investigation of volume fraction of GaP nanowires by SEM characterization and spectroscopic ellipsometry
J Škriniarová, P Hronec, J Chlpík, A Laurenčíková… - Optik, 2021 - Elsevier
In this paper we focus on investigation of GaP volume fraction in GaP nanowires (NWs)
prepared on GaP substrates by MOVPE using VLS mode. For this purpose, spectroscopic …
prepared on GaP substrates by MOVPE using VLS mode. For this purpose, spectroscopic …