Reliability-aware co-synthesis for embedded systems

Y Xie, L Li, M Kandemir, N Vijaykrishnan… - The Journal of VLSI …, 2007 - Springer
As technology scales, transient faults have emerged as a key challenge for reliable
embedded system design. This paper proposes a design methodology that incorporates …

Integer linear programming-based optimization methodology for reliability and energy-aware high-level synthesis

S Dilek, S Tosun - Microelectronics Reliability, 2022 - Elsevier
Continuous decrease in the transistor technology sizes has enabled much denser
packaging of electronic components on chips, which has resulted in integrated circuits with …

High-level synthesis of error detecting cores through low-cost modulo-3 shadow datapaths

KA Campbell, P Vissa, DZ Pan, D Chen - Proceedings of the 52nd …, 2015 - dl.acm.org
In this study, we propose a low-cost approach to error detection for arithmetic orientated data
paths by performing lightweight shadow computations in modulo-3 space for each main …

Guaranteeing performance yield in high-level synthesis

WL Hung, X Wu, Y Xie - Proceedings of the 2006 IEEE/ACM international …, 2006 - dl.acm.org
Meeting timing constraint is one of the most important issues for modern design automation
tools. This situation is exacerbated with the existence of process variation. Current high-level …

On computing nano-architectures using unreliable nano-devices

V Beiu, W Ibrahim - Nano and Molecular Electronics Handbook, 2018 - taylorfrancis.com
This chapter will start with a brief review of nanoelectronic challenges while focusing on the
reliability challenge. One of the most recent call-to-arms [1] raises two fundamental …

Reliability-aware operation chaining in high level synthesis

L Chen, M Ebrahimi, MB Tahoori - 2015 20th IEEE European …, 2015 - ieeexplore.ieee.org
System reliability becomes one of the major design concerns in nanoscale VLSI
technologies. To cope with the increasing design complexity and the challenge of cost …

A high-level synthesis methodology for energy and reliability-oriented designs

S Dilek, R Smri, S Tosun, D Dal - IEEE Transactions on …, 2020 - ieeexplore.ieee.org
Shrinking technology sizes of the CMOS circuits makes it possible to place more transistors
on a single chip at each technology generation. On the other hand, circuits become more …

Serial addition: Locally connected architectures

V Beiu, S Aunet, J Nyathi, RR Rydberg… - IEEE Transactions on …, 2007 - ieeexplore.ieee.org
This paper will briefly review nanoelectronic challenges while focusing on reliability. We
shall present and analyze a series of CMOS-based examples for addition starting from the …

A distributed clustered architecture to tackle delay variations in datapath synthesis

AA Del Barrio, J Cong… - IEEE Transactions on …, 2015 - ieeexplore.ieee.org
Due to the necessity of handling unexpected events in execution time, eg, to support
process variations, new mechanisms for dealing with every possible behavior of the …

Cost-efficient scheduling in high-level synthesis for Soft-Error Vulnerability Mitigation

Y Hara-Azumi, H Tomiyama - International Symposium on …, 2013 - ieeexplore.ieee.org
Due to the continuous reduction in chip feature size and supply voltage, soft errors are
becoming a serious problem in the today's LSI design. Most literature on system-level …