Driven by the need of reducing the defective circuits to a minimum, present-day fabrication
technologies require design techniques been complemented by effective test procedures. In …

This paper presents a methodology to perform online self-testing for analog circuits
implemented on field-programmable analog arrays (FPAAs). It proposes to partition the …

This work shows a new strategy to the on-line test of analog circuits. The technique presents
a very low analog overhead and it is completely digital. In the System-on-Chip (SoC) …

This paper presents a low-cost testing approach for switched-capacitor filters. A design for
testability (DfT) methodology is discussed, and a system-level architecture is proposed …

This paper focuses on the implementation of the'sw-op amp'concept for analog circuits
testing. Some alternative CMOS implementations are presented and compared in terms of …

This work presents an efficient methodology to on-line test field programmable analog array
(FPAA) circuits. It proposes to partition the FPAA circuit under test into sub circuits. Each sub …

Based on fault simulation experiments with two microsystems, a resonant silicon beam force
sensor and a miniature opto-electric transformer, this paper demonstrates the necessity to …

Concurrent detection of failures in analog circuits is becoming increasingly more important
as safety-critical systems become more widespread. A methodology for automatic design of …

This paper discusses the challenge of designing window comparators for analog online
testing applications. A programmable window comparator with adaptive error threshold is …

Le test de circuits analogiques et mixtes est de plus en plus coûteux, représentant parfois
jusqu'à 50% du coût total de fabrication du circuit. Les techniques de BIST (Built-In Self-Test) …